Semiconductor Conductive Layer RC Snubber for Surge Suppression

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Solution Overview

Problem

In semiconductor devices like MOSFETs, the amplitude of the drain voltage surge generated when switching from an ON to an OFF state decreases over time due to self-inductance, potentially leading to device breakdown.

Innovation Solution

A semiconductor device configuration with a conductive layer having specific portions and insulating layers that form an RC snubber circuit, increasing electric resistance and reducing current flow between the drain and source electrodes, thereby decreasing the amplitude of the drain voltage surge.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Speed

If the transistor is switched from ON to OFF state, then the switching function is achieved, but a surge voltage is generated in the drain electrode due to self-inductance

Engineering Contradiction:
Improveswitching speedVSAvoidsurge voltage
Core Design Contradiction:
SpeedVSObject-affected harmful factors

Solution Approach 1:

The patent applies preliminary action by pre-configuring an RC snubber circuit connected between the drain electrode and source electrode before switching occurs. The resistor and capacitor are positioned and dimensioned in advance to provide immediate suppression of surge voltage when the transistor switches from ON to OFF state, preventing the harmful effect before it can cause damage.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent converts the harmful surge voltage into a beneficial controlled voltage drop across the resistor. By placing a resistor in series with a capacitor between drain and source, the harmful inductive kickback is transformed into a controlled RC discharge process, where the energy that would otherwise be destructive is dissipated harmlessly through resistive heating.

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

2Reliability

If the amplitude of drain voltage is reduced, then device breakdown is prevented, but switching loss increases

Engineering Contradiction:
Improvedevice reliabilityVSAvoidswitching loss
Core Design Contradiction:
ReliabilityVSLoss of energy

Solution Approach 1:

The patent applies parameter changes by carefully selecting and optimizing the resistance and capacitance values of the snubber circuit components. By adjusting these parameters, the circuit achieves the right balance between suppressing surge voltage (improving reliability) and minimizing energy dissipation (reducing switching loss). The specific values are chosen to provide adequate protection while keeping losses acceptable.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The configuration effectively reduces the amplitude of the drain voltage surge, minimizing the risk of device breakdown and switching loss while maintaining low resistance in critical portions.

Implementation Method 1

The configuration effectively reduces the amplitude of the drain voltage surge, minimizing the risk of device breakdown and switching loss

Methodology Applied
Scientific EffectJoule heating: Joule Heating

Implementation Method 2

when the transistor is switched from an ON state to an OFF state, a surge voltage is generated in a drain electrode by self-inductance

Methodology Applied
Scientific EffectElectromagnetic induction: Electromagnetic Induction

Data Source

PatentUS9660071B2Semiconductor device
Publication Date: 2017.05.23 KK TOSHIBA
  • US9660071B2 patent drawing
  • US9660071B2 patent drawing
  • US9660071B2 patent drawing

AI summary

A semiconductor device includes a first semiconductor region of a first conductivity type, a second semiconductor region of a second conductivity type, a third semiconductor region of the first conductivity type, a conductive layer, a gate electrode, and a first electrode. The conductive layer includes a first portion, a second portion, and a third portion. The first portion is surrounded by the first semiconductor region via a first insulating portion. The second portion extends in a second direction, is provided on the first semiconductor region, and is provided on the second region. The third portion is connected between the first portion and the second portion and extends in a third direction. The first electrode is electrically connected to the third semiconductor region and the conductive layer. The second portion electrically connects the first electrode to the third portion.