Semiconductor Device Crystallization Using Substrate Seed Layer
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Solution Overview
Problem
Conventional semiconductor devices, such as PRAMs, face challenges in achieving high integration density due to the difficulty in forming single-crystalline semiconductor layers, which limits their area efficiency and electrical performance.
Innovation Solution
A method is developed to crystallize a semiconductor layer spaced apart from a substrate using a deposition process, where a non-single-crystalline semiconductor layer is formed on a substrate with exposed portions, and the substrate acts as a seed layer to change the crystalline state to single-crystalline, allowing for the formation of a single-crystalline semiconductor pattern on an interconnection line.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If a non-single-crystalline semiconductor layer is formed using deposition process, then manufacturing ease is improved, but manufacturing precision deteriorates due to inability to form single-crystalline structure
Solution Approach 1:
The substrate is prepared in advance with specific surface treatment and crystal orientation before deposition, serving as a seed layer that enables the deposited non-single-crystalline material to transform into single-crystalline structure during subsequent annealing or growth processes
Solution Approach 2:
The crystalline state of the semiconductor layer is changed by controlling deposition parameters (temperature, pressure, gas flow) and subsequent thermal processing parameters (annealing temperature, time, atmosphere) to transform from non-single-crystalline to single-crystalline structure
2Reliability
If conventional PRAM structure with transistor and phase-change pattern is used, then electrical performance is improved, but area efficiency deteriorates resulting in lower integration density
Solution Approach 1:
The semiconductor layer is extended vertically above the substrate surface, utilizing the third dimension (height) to accommodate the phase-change pattern and electrode structures, thereby reducing the horizontal footprint and unit cell area while maintaining electrical functionality
Solution Approach 2:
Multiple functional components (semiconductor layer, phase-change pattern, electrodes, insulating layers) are nested vertically within a compact structure, with each layer positioned above the previous one, achieving high integration density similar to NAND flash memory
3Manufacturing precision
If single-crystalline semiconductor layer is formed by conventional methods, then manufacturing precision is improved, but device complexity increases due to process difficulty
Solution Approach 1:
The substrate serves as an intermediary seed layer that facilitates the formation of single-crystalline structure in the deposited semiconductor material, eliminating the need for complex epitaxial growth or crystal pulling processes
Solution Approach 2:
The mechanical and thermal processes traditionally required for single-crystalline formation (Czochralski method, epitaxial growth) are replaced by deposition followed by thermal annealing, simplifying the fabrication process while achieving single-crystalline quality
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables the creation of highly integrated semiconductor devices with reduced unit cell area, achieving excellent electrical characteristics and high integration density similar to NAND flash memory devices, while enabling fast read/write operations at low voltages without the need for refresh operations.
Implementation Method 1
using the substrate as a seed layer, changing the crystalline state of the semiconductor layer to be single-crystalline
Implementation Method 2
forming a non-single-crystalline semiconductor layer on the substrate
Data Source
AI summary
A method of fabricating a semiconductor device includes sequentially forming a first pattern and a second pattern on a substrate, the second pattern being a non-single-crystalline semiconductor stacked on the first pattern, wherein a portion of the substrate is exposed adjacent to the first and second patterns, forming a non-single-crystalline semiconductor layer on the substrate, the semiconductor layer contacting the second pattern and the exposed portion of the substrate, and, using the substrate as a seed layer, changing the crystalline state of the semiconductor layer to be single-crystalline and changing the crystalline state of the second pattern to be single-crystalline.


