3D Semiconductor Detector With Resistive Biasing

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Existing semiconductor detectors face limitations such as high capacitance, sensitivity issues, smear effects, and horizontal spreading of signal charge, which hinder their efficiency in detecting deeply penetrating radiation and withstanding high voltages, especially in thick substrates.

Innovation Solution

A 3D semiconductor apparatus with a constant vertical electric field component is achieved by incorporating resistive paths between the front and back surfaces, allowing for controlled current flow and preventing horizontal signal charge spreading, thereby simplifying manufacturing and enabling high voltage resistance.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If planar detectors use thick depleted volume to detect deeply penetrating radiation, then detection efficiency improves, but depletion voltage increases proportionally to the square of thickness and horizontal spreading of signal charge occurs

Engineering Contradiction:
Improvedetection efficiencyVSAvoiddepletion voltage
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent transitions from planar (2D) electrode configuration to three-dimensional (3D) electrodes that penetrate through the substrate. This dimensional change creates a horizontal electric field component that prevents signal charge spreading while enabling thick substrate depletion at lower voltages, directly resolving the contradiction between detection efficiency and voltage consumption

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If 3D electrodes are used to prevent horizontal spreading of signal charge, then spatial resolution improves, but capacitance of signal charge collecting electrodes increases due to large surface area

Engineering Contradiction:
Improvespatial resolutionVSAvoidelectrode capacitance
Core Design Contradiction:
Measurement precisionVSQuantity of substance

Solution Approach 1:

The patent applies local quality by creating highly doped regions specifically at the 3D electrode tips where charge collection occurs. This localized high doping concentration reduces the depletion layer thickness and capacitance at the collection points while maintaining the horizontal electric field component for spatial resolution, thus resolving the contradiction between measurement precision and capacitance

Inventive Principle:
Principle #3Local quality

3Length of stationary object

If planar detectors use high voltages to create thick depletion region, then detection depth improves, but horizontal spreading of signal charge hampers spatial resolution

Engineering Contradiction:
Improvedepletion region thicknessVSAvoidspatial resolution
Core Design Contradiction:
Length of stationary objectVSMeasurement precision

Solution Approach 1:

The patent introduces a horizontal electric field component through 3D electrodes that acts perpendicular to the vertical depletion field. This horizontal field component confines signal charges vertically without requiring high voltages, enabling thick depletion regions while maintaining spatial resolution, thus resolving the contradiction between depletion region thickness and spatial resolution

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution results in a semiconductor apparatus that can be manufactured easily, has low capacitance, is immune to smear, and can withstand very high voltages without thickness-dependent electric field limitations, enhancing detection efficiency and spatial resolution.

Implementation Method 1

there is running a current between the front and back surfaces through the resistive path

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Implementation Method 2

The electric field in the depleted volume separates the electron hole pairs

Methodology Applied
Scientific EffectElectric field separation: Electric Field

Implementation Method 3

The depleted volume is created typically by a reverse biased pn junction

Methodology Applied
Scientific EffectReverse bias depletion: Electric Field

Data Source

PatentUS8426897B2Semiconductor apparatus
Publication Date: 2013.04.23 AUROLA ARTTO
  • US8426897B2 patent drawing
  • US8426897B2 patent drawing
  • US8426897B2 patent drawing

AI summary

An improved semiconductor apparatus that comprises an elongated structure that extends into the substrate. The apparatus comprises a collection contact, a resistive path, a bias connection that creates along the length of the elongated structure, an electric field component that drives signal charge carriers in a direction perpendicular to the elongated structure, and a second bias that generates a current flow that creates within the substrate a constant electric field component to drive signal charge carriers towards the collection contact on the first surface.