Semiconductor Package Fillet Layer Control With Side Trenches

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Solution Overview

Problem

Semiconductor packages with multiple chips face issues such as frequent defects and reliability degradation due to cracks, primarily caused by excessive fillet layer protrusion from the chip edges, which can lead to mechanical stress and failure.

Innovation Solution

The semiconductor package design incorporates side trenches and corner trenches in the protective layer to control the fillet layer's distribution, reducing its protrusion from the chip edges and enhancing the package's reliability by ensuring a denser fillet layer fill between the substrate and the chip.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If multiple semiconductor chips are placed within a single package in a stacked structure, then the package size is reduced and functionality is diversified, but cracks and reliability degradation occur due to excessive fillet layer protrusion

Engineering Contradiction:
Improvepackage sizeVSAvoidproduct reliability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The protective layer is segmented into multiple regions: a first region with a first depth, a second region with a second depth greater than the first depth, and a third region with a third depth greater than the second depth. This segmentation creates varying trench depths to control fillet layer distribution at different locations, preventing excessive protrusion while maintaining package compactness

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different regions of the protective layer are given different local qualities through varying trench depths. The first region (shallower) allows more fillet layer, the second region (intermediate depth) allows moderate fillet layer, and the third region (deepest) allows minimal fillet layer. This local differentiation prevents cracks at critical areas while maintaining overall package integrity

Inventive Principle:
Principle #3Local quality

2Strength

If the fillet layer is allowed to fill the space between the protective layer and semiconductor chip, then structural support is improved, but excessive protrusion from chip edges causes mechanical stress and failure

Engineering Contradiction:
Improvestructural supportVSAvoidmechanical reliability
Core Design Contradiction:
StrengthVSReliability

Solution Approach 1:

Trenches are formed in the protective layer before the fillet layer is applied. These pre-formed trenches act as barriers that guide and limit fillet layer flow, preventing excessive protrusion from occurring in the first place rather than correcting it afterward

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The trenches, which initially seem to reduce the filling space, actually benefit the structure by preventing harmful fillet layer protrusion. The reduced fillet layer volume in certain regions converts what would be a harmful protrusion into a beneficial controlled distribution, eliminating mechanical stress while maintaining structural support

Inventive Principle:
Principle #22Blessing in disguise (Convert harm into benefit)

Data Source

PatentUS11901339B2Semiconductor package including a fillet layer
Publication Date: 2024.02.13 SAMSUNG ELECTRONICS CO LTD
  • US11901339B2 patent drawing
  • US11901339B2 patent drawing
  • US11901339B2 patent drawing

AI summary

A semiconductor package includes a base substrate having a first semiconductor substrate, and a first protective layer covering a top side thereof. A first semiconductor chip is on the first protective layer. A first fillet layer fills a space between the first protective layer and the first semiconductor chip. A first side surface of the base substrate extends in a first direction, and second and third side surfaces extend in a second direction. The base substrate includes two corner regions and a side region between the corner regions. A first protective layer in the side region includes a first side trench which overlaps the first semiconductor chip. A part of the first fillet layer fills the first side trench.