Semiconductor Device Inter-Pillar Channel Layer for High Density

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current three-dimensional memory devices face challenges in achieving higher storage capacity and performance due to limitations in channel length and chip density.

Innovation Solution

The semiconductor device features a channel layer disposed between two conductive pillars, reducing channel length and increasing chip density by altering the stacking configuration of conductive and insulating layers, with the channel layer coupled to both pillars and surrounding the memory structure.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the channel layer is arranged outside the first conductive pillar and the second conductive pillar and surrounds them, then the channel layer can be continuously formed, but the channel length becomes longer which reduces device performance

Engineering Contradiction:
Improvedevice performanceVSAvoidchannel length
Core Design Contradiction:
ReliabilityVSLength of moving object

Solution Approach 1:

The channel layer is repositioned from a surrounding configuration to an inter-pillar configuration, utilizing the space between the first and second conductive pillars. This spatial reconfiguration in a different dimensional arrangement reduces the channel length from extending around the pillars to only spanning the gap between them, thereby improving device performance while maintaining continuous channel formation.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Instead of the conventional approach where the channel layer surrounds the conductive pillars, this invention inverts the arrangement by placing the channel layer between the pillars. This inversion of the spatial relationship fundamentally reduces the channel length and improves device performance.

Inventive Principle:
Principle #13The other way round (Inversion)

2Quantity of substance

If the channel layer surrounds the conductive pillars, then the structure is simpler to fabricate, but the chip density is reduced

Engineering Contradiction:
Improvechip densityVSAvoidstacking configuration
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The channel layer is repositioned from a surrounding configuration to an inter-pillar configuration, utilizing the space between the first and second conductive pillars. This spatial reconfiguration in a different dimensional arrangement reduces the channel length, thereby improving device performance while maintaining continuous channel formation.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

Instead of the conventional approach where the channel layer surrounds the conductive pillars, this invention inverts the arrangement by placing the channel layer between the pillars. This inversion of the spatial relationship fundamentally reduces the channel length and improves device performance.

Inventive Principle:
Principle #13The other way round (Inversion)

Data Source

PatentUS11476276B2Semiconductor device and method for fabricating the same
Publication Date: 2022.10.18 MACRONIX INTERNATIONAL CO LTD
  • US11476276B2 patent drawing
  • US11476276B2 patent drawing
  • US11476276B2 patent drawing

AI summary

A semiconductor device includes a stack and a plurality of memory strings. The stack is formed on a substrate, and the stack includes conductive layers and insulating layers alternately stacked. The memory strings penetrate the stack along a first direction. Each of the memory strings includes a first conductive pillar, a second conductive pillar, a channel layer and a memory structure. The first conductive pillar and the second conductive pillar extend along the first direction, respectively, and electrically isolated to each other. The channel layer extends along the first direction. The channel layer is disposed between the first conductive pillar and the second conductive pillar, and the channel layer is coupled to the first conductive pillar and the second conductive pillar. The memory structure surrounds the first conductive pillar, the second conductive pillar and the channel layer.