Semiconductor Device Latch Circuit Non-Volatile Memory Programming
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Solution Overview
Problem
Existing semiconductor devices face inefficiencies in programming repair and configuration information into non-volatile memory circuits, which are time-consuming and complex due to the need for external testing and analysis, and the slow data retrieval from array-based non-volatile memory, making immediate repair operations challenging.
Innovation Solution
A semiconductor device with a latch circuit for storing test results and a control unit that selectively programs information in a non-volatile memory circuit based on pass/failure test results, allowing for direct programming without external communication of test results, using internal program commands to manage data entry into the non-volatile memory.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stability of the object's composition
If non-volatile memory circuit is used to store repair information, then information retention is improved, but data retrieval speed deteriorates
Solution Approach 1:
The patent segments the memory system into two parts: a non-volatile memory circuit for storing repair information (improving retention) and a latch circuit for temporarily holding test results (enabling fast access). This segmentation allows the system to benefit from both slow but reliable storage and fast but volatile storage simultaneously.
Solution Approach 2:
The latch circuit acts as an intermediary between the non-volatile memory circuit and the repair operation. It temporarily holds test results and enables immediate repair operations without waiting for slow data retrieval from non-volatile memory, thus resolving the speed bottleneck.
2Measurement precision
If external testing and analysis is used for programming repair information, then testing accuracy is improved, but programming time and complexity increase
Solution Approach 1:
The semiconductor device performs self-testing and self-programming. The internal test circuit generates test results, the latch circuit stores these results, and the control circuit automatically programs the non-volatile memory circuit based on the stored test results. This eliminates the need for external testing and analysis equipment, significantly reducing programming time and complexity while maintaining testing accuracy.
Solution Approach 2:
The patent merges multiple functions into a single integrated system: test circuit for generating test results, latch circuit for storing results, control circuit for processing, and non-volatile memory circuit for storage. This integration allows the device to perform testing and programming internally without external intervention, resolving the time and complexity issues associated with external processes.
3Ease of manufacture
If laser fuse is used for storing repair addresses, then manufacturing simplicity is improved, but chip area consumption increases
Solution Approach 1:
The patent replaces the mechanical laser fuse system with an electrical/electronic system consisting of a non-volatile memory circuit. This substitution eliminates the need for physical laser cutting processes while achieving the same function of storing repair addresses, thereby reducing chip area consumption while maintaining ease of manufacture through standard semiconductor fabrication processes.
Data Source
AI summary
A semiconductor device includes a latch circuit suitable for storing a test result; a non-volatile memory circuit suitable for storing information used for an operation of the semiconductor device; a decoding unit suitable for generating one or more internal program commands by using one or more control signals; and a control unit suitable for programming information in the non-volatile memory circuit in response to the test result stored in the latch circuit when the internal program commands are activated.