Semiconductor Memory Interconnect Stacking for Higher Capacity

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Solution Overview

Problem

Existing semiconductor memory devices face challenges in achieving high integration and capacity while maintaining efficient data storage and retrieval operations, particularly in three-dimensional memory structures.

Innovation Solution

A semiconductor memory device with a specific configuration that includes a semiconductor layer, multiple interconnect layers, memory pillars, and members that enhance electrical connectivity and structural integrity, allowing for efficient data storage and retrieval.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If a three-dimensional memory structure is adopted for higher integration, then storage capacity increases, but manufacturing complexity and process difficulty increase

Engineering Contradiction:
Improvestorage capacityVSAvoidmanufacturing complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent transitions from planar two-dimensional memory structures to three-dimensional vertical structures by stacking multiple interconnect layers (first interconnect layer, second interconnect layer) above the substrate, with memory pillars extending vertically to contact the semiconductor layer. This dimensional change enables higher storage capacity within the same footprint area.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

Solution Approach 2:

The memory device is segmented into distinct functional layers including substrate, first interconnect layer, second interconnect layer, semiconductor layer, and memory pillars. This segmentation allows independent optimization and manufacturing of each layer, reducing overall process difficulty while maintaining high integration.

Inventive Principle:
Principle #1Segmentation

2Reliability

If multiple interconnect layers are stacked to increase integration, then electrical connectivity improves, but structural integrity and alignment precision become more difficult to maintain

Engineering Contradiction:
Improveelectrical connectivityVSAvoidalignment precision
Core Design Contradiction:
ReliabilityVSManufacturing precision

Solution Approach 1:

The first and second interconnect layers are merged in the vertical stacking sequence, with both layers positioned between the substrate and semiconductor layer. This merging creates a consolidated interconnect structure that maintains electrical connectivity while simplifying the overall manufacturing process by reducing the number of separate stacking operations required.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS12408344B2Semiconductor memory device
Publication Date: 2025.09.02 KIOXIA CORP
  • US12408344B2 patent drawing
  • US12408344B2 patent drawing
  • US12408344B2 patent drawing

AI summary

According to one embodiment, a semiconductor memory device includes: a semiconductor layer arranged above a substrate in a first direction; a first interconnect layer between the substrate and the semiconductor layer; a second interconnect layer arranged adjacent to the first interconnect layer in a second direction; a plurality of memory pillars; and a first member between the first interconnect layer and the second interconnect layer. The semiconductor layer has, on a side of a second surface facing a first surface in contact with the first member, a first projecting portion projecting in the first direction and overlapping a part of an area in the first direction, the area being provided with the first interconnect layer and the first member.