Semiconductor Module Inspection Fixture with Rotating Spherical Section
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Solution Overview
Problem
Existing devices for inspecting semiconductor module packages are complex and expensive, necessitating a simpler and more cost-effective solution.
Innovation Solution
A module inspection fixture with a hollow base and a rotating spherical section that allows for 90-degree tilting and rotation, enabling comprehensive inspection of semiconductor modules using a simple, manually operated setup.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sophisticated inspection devices with cameras and illumination sources are used, then inspection capability is improved, but device complexity and cost increase
Solution Approach 1:
The patent extracts the essential inspection function from complex automated systems and implements it through a simple mechanical fixture that holds the module at various angles, eliminating the need for cameras and sophisticated electronics while maintaining inspection capability
Solution Approach 2:
Instead of using complex devices to inspect modules, the patent inverts the approach by using a simple fixture to position the module itself, allowing the inspector to examine it from multiple angles through manual rotation and tilting
2Measurement precision
If sophisticated inspection devices with cameras and illumination sources are used, then inspection capability is improved, but manufacturing cost increases
Solution Approach 1:
The patent employs inexpensive materials such as aluminum or Plexiglas for the fixture construction, replacing expensive camera systems and illumination devices with a simple, easily manufactured mechanical holder that achieves the same inspection goal at minimal cost
3Adaptability or versatility
If the module can be tilted and rotated up to 90 degrees, then inspection thoroughness is improved, but device complexity increases
Solution Approach 1:
The patent uses a spherical section that can rotate within a hollow base, allowing the module to be tilted and rotated up to 90 degrees in all directions through simple spherical geometry, providing comprehensive inspection access without complex mechanical mechanisms
Data Source
AI summary
An apparatus for inspecting semiconductor module packages which includes a cylindrical base section, a truncated spherical section superimposed on the cylindrical base capable of being rotated and tilted on the cylindrical base section, and a tray section superimposed on the truncated section.