Semiconductor Package Dummy Patterns for Warpage Control

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Solution Overview

Problem

Fan-out semiconductor packages experience warpage due to differences in thermal expansion coefficients between components, particularly in the corner regions, leading to bending issues when heated.

Innovation Solution

Incorporating dummy patterns in the corner regions of the semiconductor package, which are made of the same material as the redistribution wiring layers, to increase the thermal expansion coefficient and act as reinforcing patterns, thereby preventing warpage.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of stationary object

If the package uses a thin frame structure with redistribution wiring layers, then the total package thickness is reduced, but corner portions roll up when heated causing smile warpage

Engineering Contradiction:
Improvepackage thicknessVSAvoidpackage flatness
Core Design Contradiction:
Length of stationary objectVSStability of the object's composition

Solution Approach 1:

The patent applies local quality by placing dummy patterns specifically at the corner portions of the package where warpage occurs. These dummy patterns are made of the same material as the redistribution wiring layers and have the same thickness, creating localized reinforcement only where needed rather than uniformly across the entire package structure.

Inventive Principle:
Principle #3Local quality

Solution Approach 2:

The patent utilizes thermal expansion by designing dummy patterns with the same thermal expansion characteristics as the redistribution wiring layers. When heated, these dummy patterns expand at the same rate as the surrounding wiring layers, compensating for differential thermal expansion and preventing the corner portions from rolling up.

Inventive Principle:
Principle #37Thermal expansion

2Stability of the object's composition

If dummy patterns are added to corner regions, then warpage is prevented through increased thermal expansion coefficient, but the package structure becomes more complex

Engineering Contradiction:
Improvepackage flatnessVSAvoidredistribution wiring layer structure
Core Design Contradiction:
Stability of the object's compositionVSDevice complexity

Solution Approach 1:

The patent applies homogeneity by making the dummy patterns identical in material composition and thickness to the redistribution wiring layers. This uniformity simplifies the manufacturing process as the dummy patterns can be formed using the same processes and materials as the existing wiring layers, despite adding structural elements.

Inventive Principle:
Principle #33Homogeneity

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The dummy patterns effectively compensate for the thermal expansion differences, reducing the likelihood of warpage and enhancing the structural integrity of the package, especially in high-temperature conditions.

Implementation Method 1

due to a difference in coefficient of thermal expansion between individual components of the package, corner portions of a peripheral region of the package that is relatively weak may be rolled up when it is heated

Methodology Applied
Scientific EffectThermal expansion: Thermal Expansion

Data Source

PatentUS11594488B2Semiconductor package and method of manufacturing the semiconductor package
Publication Date: 2023.02.28 SAMSUNG ELECTRONICS CO LTD
  • US11594488B2 patent drawing
  • US11594488B2 patent drawing
  • US11594488B2 patent drawing

AI summary

A semiconductor package includes a substrate, at least one semiconductor chip arranged in the substrate and having chip pads, and a redistribution wiring layer covering a lower surface of the substrate and including first and second redistribution wirings and dummy patterns, the first and second redistribution wirings being stacked in at least two levels and connected to the chip pads. The first and second redistribution wirings are arranged in a redistribution region of the redistribution wiring layer, and the dummy patterns extend in an outer region outside the redistribution region to partially cover corner portions of the redistribution wiring layer, respectively.