Semiconductor Package Reinforcement Structure for Thin Impact Resistance

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Solution Overview

Problem

As semiconductor packages become thinner, they are prone to cracks or breakage even under mild impact due to reduced structural integrity.

Innovation Solution

Incorporation of a reinforcement structure with multiple reinforcement parts and a post electrically connected to the wiring, surrounded by a molding member, which enhances the package's durability against compressive, bending, and shear stresses.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Length of moving object

If the thickness of the semiconductor package is decreased, then the size of mobile devices can be reduced, but cracks or breakage occur more easily under mild impact

Engineering Contradiction:
Improvethickness of semiconductor packageVSAvoidstructural integrity against impact
Core Design Contradiction:
Length of moving objectVSStrength

Solution Approach 1:

The patent employs a composite structure combining semiconductor die, re-wiring layers, molding material, and reinforcement structures with different material properties. The reinforcement structure uses materials with higher mechanical strength than the semiconductor die alone, creating a composite package that maintains thin profile while improving impact resistance through material composition rather than increasing overall thickness.

Inventive Principle:
Principle #40Composite materials

Solution Approach 2:

The package is divided into distinct functional segments: semiconductor die, first re-wiring layer, reinforcement structure, molding member, and second re-wiring layer. The reinforcement structure is further segmented into multiple reinforcement parts spaced apart from each other and from the semiconductor die. This segmentation allows each component to perform its specific function while collectively providing enhanced structural integrity without increasing package thickness.

Inventive Principle:
Principle #1Segmentation

2Strength

If reinforcement structures are added to improve durability, then resistance to mechanical stress increases, but device complexity increases

Engineering Contradiction:
Improvedurability against mechanical stressVSAvoidstructural complexity
Core Design Contradiction:
StrengthVSDevice complexity

Solution Approach 1:

The reinforcement structure serves multiple functions simultaneously: it provides mechanical reinforcement against impact and stress, acts as a structural support framework, and maintains spacing between components. The post structure similarly serves both electrical connection and mechanical anchoring functions. This multi-functionality reduces the need for separate dedicated components, thereby limiting complexity increase.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

Rather than uniformly reinforcing the entire package, the reinforcement structure applies localized reinforcement at critical stress points and interfaces. The reinforcement parts are strategically positioned between the semiconductor die and molding member, and the post is placed at specific locations for electrical and mechanical support. This localized approach provides necessary strength while minimizing added structural complexity.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS20250349742A1Semiconductor package
Publication Date: 2025.11.13 SAMSUNG ELECTRONICS CO LTD
  • US20250349742A1 patent drawing
  • US20250349742A1 patent drawing
  • US20250349742A1 patent drawing

AI summary

A semiconductor package includes: a first re-wiring layer including a first wiring; a semiconductor die placed on the first re-wiring layer; a post placed on the first re-wiring layer, and spaced apart from the semiconductor die, wherein the post is electrically connected to the first wiring; and a reinforcement structure including a first reinforcement part and a second reinforcement part, wherein the first reinforcement is placed on the first re-wiring layer, and is spaced apart from the semiconductor die and the post such that it is placed between the semiconductor die and the post, and wherein the second reinforcement part protrudes from the first reinforcement part.