Semiconductor Pad Driving via Dynamic Switching
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Solution Overview
Problem
Current semiconductor systems lack an efficient method to verify the normal operation of semiconductor devices, particularly in testing scenarios where data transmission and pad driving capabilities are critical, especially in high-frequency operations.
Innovation Solution
A semiconductor system comprising a first semiconductor device that outputs test mode enable and switch control signals to a second semiconductor device, which includes data output units and a switch unit to electrically couple pads in response to these signals, allowing for the determination of normal operation by driving test pads with internal data and switch control signals.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple data output units are added to drive multiple pads simultaneously, then the data transmission capability and test coverage are improved, but the device complexity and manufacturing cost increase
Solution Approach 1:
The patent combines multiple data output units into a single shared data output unit that can be dynamically allocated to different pads through a switching mechanism. This merging approach maintains the capability to drive multiple pads simultaneously while reducing the total number of dedicated output units, thereby lowering device complexity and manufacturing cost.
Solution Approach 2:
The patent introduces a dynamic switching mechanism that allows a single data output unit to be dynamically assigned to different pads based on test requirements. This dynamic allocation enables the system to achieve multi-pad driving capability without permanently duplicating output units, resolving the contradiction between productivity and device complexity.
2Device complexity
If a single shared data output unit is used to reduce device complexity, then manufacturing cost is reduced, but the ability to drive multiple pads simultaneously is limited
Solution Approach 1:
The patent introduces a switching unit as an intermediary component between the single shared data output unit and multiple pads. This intermediary enables the single output unit to dynamically connect to different pads or combinations of pads, maintaining high data transmission capability while avoiding the need for multiple dedicated output units.
3Reliability
If additional data output units are added to improve test coverage, then testing completeness is improved, but the manufacturing cost and device complexity increase
Solution Approach 1:
The patent designs a universal data output unit that can serve multiple testing functions by dynamically connecting to different pads. This multi-functional approach ensures comprehensive test coverage without requiring separate dedicated output units for each test scenario, thereby reducing manufacturing cost while maintaining testing completeness.
Data Source
AI summary
A semiconductor system includes a first semiconductor device and a second semiconductor device. The first semiconductor device outputs a test mode enable signal and a switch control signal and receives test data. The second semiconductor device generates first internal data and second internal data in response to the test mode enable signal, drives a first pad in response to the first internal data, drives a second pad in response to the second internal data, and drives a third pad in response to the first and second internal data according to the switch control signal.