Semiconductor Device Program Voltage Control Logic
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Solution Overview
Problem
Current semiconductor devices face inefficiencies in program operation time due to repeated program and verification operations, which are time-consuming and power-intensive, especially in non-volatile memory devices like flash memory.
Innovation Solution
The semiconductor device employs a control logic to detect and store the number of program pulses during an initial program operation, using this information to determine subsequent program voltage levels, thereby reducing the number of pulses required for subsequent operations through a FIFO buffer system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If repeated program and verification operations are performed to ensure data programming, then reliability of data storage is improved, but program operation time increases
Solution Approach 1:
The patent applies preliminary action by detecting and storing the number of program pulses during a first program operation, then using this pre-acquired information to determine the initial level of program voltage in subsequent operations. This allows the system to skip redundant verification steps and directly adjust voltage levels based on historical data, thereby reducing program operation time while maintaining data storage reliability through optimized voltage control
2Reliability
If repeated program and verification operations are performed to ensure data programming, then reliability of data storage is improved, but power consumption increases
Solution Approach 1:
The patent implements feedback by using the detected number of program pulses from previous operations to dynamically adjust the initial level of program voltage in subsequent operations. This feedback mechanism allows the system to optimize power consumption by avoiding redundant high-voltage application and verification cycles, while still ensuring reliable data storage through intelligent voltage level selection based on operational history
3Loss of time
If the number of program pulses is detected and stored to optimize subsequent operations, then program operation time is reduced, but device complexity increases
Solution Approach 1:
The patent applies preliminary action by pre-detecting and storing program pulse information in a register during initial operations. This stored information is then reused to determine voltage levels in subsequent operations, reducing program time without requiring complex real-time analysis. The control logic complexity is minimized by using simple storage and retrieval operations rather than complex computational algorithms
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach significantly reduces program operation time by optimizing the program voltage levels, enhancing efficiency and reducing power consumption in semiconductor devices.
Implementation Method 1
a control logic suitable for detecting the number of pulses of the program voltage received from the memory cell array
Implementation Method 2
storing bias information corresponding to the detected number of program pulses in a first-in-first-out (FIFO) buffer
Data Source
AI summary
A semiconductor device comprises a memory cell array comprising memory cells coupled to word lines and bit lines, a voltage generator suitable for generating a drive voltage to be applied to a selected word line, and a control logic suitable for detecting the number of pulses of a program voltage received from the memory cell array in a program operation, storing bias information corresponding to the detected number of pulses in a register, and controlling a level of the program voltage for a subsequent program operation based on the bias information.