Semiconductor Setup Data Transfer via Shared Buses
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Solution Overview
Problem
Conventional semiconductor devices face challenges in efficiently transferring setup data stored in fuse circuits to various constituent elements, particularly due to limitations with laser fuses and the difficulty in applying e-fuse arrays, which require significant space and additional amplifiers.
Innovation Solution
A semiconductor device incorporating a non-volatile memory, such as an e-fuse array, that generates selection codes and transfers setup data through dedicated buses to setup circuits, allowing for efficient data transfer during both test and boot-up operations, thereby reducing the need for additional lines and minimizing device area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If laser fuses are used to store setup data, then the data can be stored permanently, but the data cannot be programmed after mounting on a package
Solution Approach 1:
The patent changes the physical state parameter of the fuse from irreversible (laser fuse) to reversible (electrical fuse), allowing the fuse to be programmed multiple times after mounting. The electrical fuse uses a transistor that can be switched between conductive and non-conductive states through voltage application, enabling post-mount programming while maintaining permanent storage capability.
2Adaptability or versatility
If e-fuse arrays are used to store setup data, then post-mount programming is enabled, but significant space and additional amplifiers are required
Solution Approach 1:
The patent merges the e-fuse array with the existing command decoder and setup circuits by using shared buses and integrated control logic. The selection code transfer bus and setup data transfer bus are shared resources that serve multiple functions, eliminating the need for separate dedicated lines and reducing overall device area.
Solution Approach 2:
The command decoder serves multiple functions: it decodes external commands, generates test selection codes, generates test setup data, and controls the data transfer process during boot-up. This multi-functionality reduces the need for separate dedicated circuits and minimizes device area.
3Productivity
If additional lines are added for data transfer, then data transfer capability is improved, but device area increases
Solution Approach 1:
The command decoder and existing buses are made universal by enabling them to handle both test mode operations and boot-up operations. The same selection code transfer bus and setup data transfer bus are used for both purposes, eliminating the need for separate dedicated lines and reducing device area while maintaining data transfer efficiency.
Data Source
AI summary
A memory device includes a command decoder for generating a test selection code and a test setup data by decoding an external command and an external address, a non-volatile memory for storing an internal setup data, a counter for generating an internal selection code by counting a clock, a first selector for selecting the test selection code during a test mode operation, selecting the internal selection code during a boot-up operation, and transferring the selected selection code through a selection code transfer bus, a second selector for selecting the test setup data during the test mode operation, selecting the internal setup data that is outputted from the non-volatile memory during the boot-up operation, and transferring the selected selection code through a setup data transfer bus; and setup circuits for performing a setup operation based on the information transferred through the selection code transfer bus and the setup data transfer bus.