Semiconductor Storage Voltage Adjusting Circuit

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Solution Overview

Problem

Conventional high voltage regulator circuits in semiconductor storage devices often suffer from uneven zener diode withstand voltage, leading to non-uniform output voltage during data erasure or writing, which can degrade storage units and result in misoperation, and low production efficiency due to disqualified goods caused by high voltage deviations.

Innovation Solution

Incorporating a voltage adjusting circuit that uses voltage modifying data to adjust the potential of a voltage setting element, such as zener diodes, to maintain precise high voltage levels, and utilizing a storage portion to store voltage modifying data for fine-tuning the high voltage provided to the memory, thereby ensuring uniformity and accuracy.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Power

If a conventional high voltage regulator circuit using zener diodes is used, then high voltage can be generated for data erasure and writing, but the output voltage becomes non-uniform due to variations in zener diode withstand voltage

Engineering Contradiction:
Improvehigh voltage generationVSAvoidoutput voltage uniformity
Core Design Contradiction:
PowerVSManufacturing precision

Solution Approach 1:

The patent changes the parameters of the voltage setting elements by selecting zener diodes with different withstand voltages to compensate for process variations. Specifically, it uses a first zener diode with a first withstand voltage and a second zener diode with a second withstand voltage, where the ratio between them is controlled to maintain uniform output voltage across different devices despite manufacturing variations.

Inventive Principle:
Principle #35Parameter changes

2Productivity

If high voltage is applied to storage units for data rewriting, then data can be erased or written, but the storage units may be degraded or damaged if voltage is not precisely controlled

Engineering Contradiction:
Improvedata rewriting capabilityVSAvoidstorage unit lifespan
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The patent implements a feedback mechanism where the output voltage of the high voltage regulator circuit is monitored and compared against a reference voltage. Based on this comparison, the circuit automatically adjusts the voltage setting elements (zener diodes) to maintain the output voltage within a precise range, preventing both under-voltage (which would fail to rewrite data) and over-voltage (which would damage storage units).

Inventive Principle:
Principle #23Feedback

3Manufacturing precision

If zener diodes are used for voltage regulation, then high voltage can be maintained at a fixed level, but production efficiency decreases due to disqualified devices caused by voltage deviations

Engineering Contradiction:
Improvevoltage control precisionVSAvoidproduction efficiency
Core Design Contradiction:
Manufacturing precisionVSProductivity

Solution Approach 1:

The patent systematically varies the parameters of the voltage setting elements during manufacturing to create a distribution of output voltages. By controlling the ratio between the withstand voltages of multiple zener diodes, it ensures that the majority of produced devices fall within the acceptable voltage range, thereby reducing the number of disqualified devices and improving production efficiency.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach enhances the precision of high voltage delivery to the memory, reduces the number of disqualified semiconductor storage device dies, increases yield rate, and extends the lifespan of the devices by maintaining voltage within tolerance intervals.

Implementation Method 1

the zener diode 64 turns on and a current flows through the FET 63, the zener diode 64, the FET 65 and the FET 66

Methodology Applied
Scientific EffectZener effect: Avalanche Breakdown

Data Source

PatentUS8638610B2Semiconductor storage device
Publication Date: 2014.01.28 ROHM CO LTD
  • US8638610B2 patent drawing
  • US8638610B2 patent drawing
  • US8638610B2 patent drawing

AI summary

The invention provides a semiconductor storage device which can restrain the uneven high voltage applied to the storage unit and can provide the high voltage with high precision. The semiconductor storage device includes a storage unit array, a Y decoder circuit, a X decoder circuit, a sense amplifier circuit, a Y gate circuit, a high voltage generating circuit, a high voltage regulator circuit, and a voltage adjusting circuit. The voltage modifying data for adjusting the potential of the anode of the zener diode so as to adjust the high voltage applied to the storage unit array is written into the storage unit array. The voltage modifying data is used to adjust voltage by the voltage adjusting circuit.