Semiconductor Testing Rule Management System
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Solution Overview
Problem
The increasing complexity and density of semiconductor devices due to advances in technology lead to higher testing demands, resulting in increased costs and complexities in semiconductor testing processes, particularly in distinguishing between good and faulty devices.
Innovation Solution
A system and method for creating and managing rules in semiconductor testing, including a comparator to resolve relationships between rules, a simulator to quantify parameter values, and actualization modules to execute rules, facilitating efficient and adaptive testing processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If more comprehensive testing is performed to distinguish between good and faulty devices, then product reliability is improved, but test cost and manufacturing complexity increase
Solution Approach 1:
The patent segments the testing process into multiple test sockets or test stages, where different testing functions are performed in sequence. This allows comprehensive testing to be divided into manageable segments, improving reliability through thorough testing while controlling manufacturing complexity through structured organization of test operations.
Solution Approach 2:
The patent employs dynamic test program selection and adaptation, where testing parameters and sequences are adjusted based on device characteristics and test results. This dynamic approach enables comprehensive testing to be performed efficiently, improving reliability while reducing unnecessary testing steps that would increase manufacturing complexity.
2Measurement precision
If more test time is allocated to testing, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The patent implements periodic testing cycles with multiple test sockets, where devices undergo systematic testing at different stages. This periodic structure allows sufficient test time to be allocated for accurate measurements while maintaining productivity through continuous flow and parallel processing across multiple test stations.
Solution Approach 2:
The patent performs preliminary testing and characterization at earlier test sockets to identify devices that require more comprehensive testing. This preliminary action allows test time to be focused on devices that need it, improving measurement precision for critical cases while maintaining high productivity by quickly processing devices that pass initial screening.
Data Source
AI summary
Methods and systems for semiconductor testing. In one embodiment, a semiconductor testing method includes one or more of the following stages: defining a rule relating to semiconductor testing, validating the rule, bundling the rule with other rules, correlating the rule with other rules, publishing the rule, actualizing the rule, and follow up relating to the rule. In one embodiment, a semiconductor testing system includes one or more of the following modules: rule creation module(s), analysis module(s), simulation module(s), real time production module(s), and offline production module(s). In one embodiment, user friendly graphical user interface(s) can be used for defining the building blocks of a rule and/or for viewing an optional hierarchy of categories to which the rule belongs.