Semiconductor Supply Voltage Control for Per-Part Aging Compensation
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Solution Overview
Problem
Existing high-volume manufacturing (HVM) methods struggle to predict and account for per-part aging variations in semiconductor devices, leading to inefficient power consumption and potential yield loss due to fixed voltage guardbands that do not adapt to individual device performance degradation.
Innovation Solution
Implementing a software-based control apparatus that measures aging characteristics on a per-part basis using In-Die Variation (IDV) oscillators and error counters to dynamically adjust the supply voltage, adapting it to the device's specific aging progression, thereby reducing energy consumption and maintaining performance.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fixed voltage guardband is applied to all semiconductor devices, then reliability is maintained across the device population, but power consumption increases and yield is reduced due to over-provisioning
Solution Approach 1:
The patent segments the semiconductor device population into individual devices, each with its own measured aging characteristics. Instead of applying a uniform guardband to all devices, each device receives a customized guardband based on its specific aging progression measured through ring oscillators and error counters. This segmentation enables differentiated voltage provisioning that matches actual device needs.
Solution Approach 2:
The patent dynamically changes the supply voltage parameter based on measured aging characteristics. The guardband voltage is adjusted as a function of accumulated errors and ring oscillator frequency shifts, allowing the voltage to adapt to the device's actual aging state rather than remaining fixed. This parameter change optimizes power consumption while maintaining reliability.
2Stability of the object's composition
If a fixed voltage guardband is applied to all semiconductor devices, then performance consistency is maintained, but manufacturing yield is reduced due to conservative provisioning
Solution Approach 1:
The patent segments the device population to allow individual performance characterization. By measuring aging characteristics separately for each device using ring oscillators and error counters, the system can provision voltage based on actual device performance rather than worst-case assumptions. This segmentation enables higher yield by avoiding over-provisioning of devices that don't require it.
Solution Approach 2:
The patent implements feedback mechanisms where ring oscillators and error counters continuously monitor device aging characteristics. This feedback information is used to adjust the guardband voltage dynamically, ensuring performance consistency is maintained while optimizing yield. The feedback loop enables real-time adaptation to device degradation.
3Reliability
If statistical guardbands are applied based on population data, then aging effects are compensated, but per-part variations in aging cannot be accounted for
Solution Approach 1:
The patent segments the aging compensation approach from population-level statistics to individual device measurement. Each device has its own ring oscillators and error counters that directly measure its aging characteristics, enabling per-part adaptation. This segmentation allows the system to capture and respond to individual device variations in aging behavior.
Solution Approach 2:
The patent enables each semiconductor device to self-measure its own aging characteristics through integrated ring oscillators and error counters. Each device autonomously generates feedback about its degradation state, eliminating the need for external population-based statistical models. This self-service approach provides accurate per-part aging information for customized voltage provisioning.
4Speed
If higher supply voltage is applied to compensate for aging, then performance is maintained, but power consumption and heat generation increase
Solution Approach 1:
The patent dynamically changes the supply voltage parameter based on actual device aging measurements rather than applying a fixed high voltage. The guardband voltage is adjusted as a function of measured ring oscillator frequency shifts and error counts, increasing voltage only when and where needed to maintain performance. This parameter optimization reduces unnecessary power consumption and heat generation.
Data Source
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Figure 2b
AI summary
Examples relate to control apparatus, a control device, a method and a computer program for determining a device-specific supply voltage for a semiconductor device, and to a corresponding semiconductor device and corresponding systems. The control apparatus is configured to obtain measurement data of measurement circuitry of the semiconductor device, the measurement data being related to a progress of aging of the semiconductor device. The control apparatus is configured to determine the device-specific supply voltage of the semiconductor device based on the measurement data. The control apparatus is configured to provide information on the device-specific supply voltage for a supply voltage control apparatus.