Semiconductor Sense Gate Trench for Field Reduction

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Solution Overview

Problem

In semiconductor devices, there is a challenge in reducing electric field concentration, particularly in the active region where the main transistor and sense transistor sections are located, which can lead to voltage fluctuations and inefficiencies.

Innovation Solution

The semiconductor device incorporates a sense transistor section with a sense gate trench section extending from the outer region to the main well region on the semiconductor substrate, allowing it to follow voltage fluctuations and reduce electric field concentration by being electrically connected to the main gate trench section, thereby maintaining synchronization with the main transistor section.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If a sense transistor section is provided outside the active region to detect current, then measurement capability is improved, but electric field concentration occurs between the main and sense transistor sections

Engineering Contradiction:
Improvecurrent detection capabilityVSAvoidelectric field concentration
Core Design Contradiction:
Measurement precisionVSObject-affected harmful factors

Solution Approach 1:

A potential equalization trench is introduced as an intermediary structure between the main transistor section and sense transistor section. This trench, filled with conductive material, acts as a mediator to equalize potentials and eliminate harmful electric field concentration, allowing the sense transistor to function without being affected by the main transistor's electric field.

Inventive Principle:
Principle #24Intermediary (Mediator)

Solution Approach 2:

The semiconductor device is segmented into distinct regions: an active region containing the main transistor, an inactive region containing the sense transistor, and a potential equalization trench separating them. This segmentation isolates the sense transistor from harmful electric fields while maintaining its measurement function.

Inventive Principle:
Principle #1Segmentation

2Adaptability or versatility

If the sense transistor section is placed outside the active region, then it can detect current without interfering with main transistor operation, but voltage fluctuations occur affecting synchronization

Engineering Contradiction:
Improveindependent detection functionVSAvoidvoltage stability
Core Design Contradiction:
Adaptability or versatilityVSStability of the object's composition

Solution Approach 1:

The potential equalization trench creates an equipotential region between the active and inactive regions. By filling the trench with conductive material and connecting it to appropriate potentials, the structure ensures that both the main transistor section and sense transistor section operate at stable, synchronized potentials, eliminating voltage fluctuations while maintaining independent detection capability.

Inventive Principle:
Principle #12Equipotentiality

3Reliability

If electric field concentration is reduced through structural modifications, then voltage stability is improved, but device complexity increases

Engineering Contradiction:
Improvevoltage stabilityVSAvoidstructural complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The potential equalization trench serves multiple functions simultaneously: it acts as a barrier to electric field concentration, provides potential equalization between regions, and can be integrated with existing transistor structures. This multi-functionality achieves voltage stability without proportionally increasing device complexity.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS10700059B2Semiconductor device
Publication Date: 2020.06.30 FUJI ELECTRIC CO LTD
  • US10700059B2 patent drawing
  • US10700059B2 patent drawing
  • US10700059B2 patent drawing

AI summary

In order to reduce electric field concentration in a semiconductor device including a main transistor section and a sense transistor section, the semiconductor device is provided, the semiconductor device including a semiconductor substrate of a first conductivity type, a main transistor section in an active region on the semiconductor substrate, and a sense transistor section outside the active region on the semiconductor substrate, wherein the active region is provided with a main well region of a second conductivity type, and wherein the sense transistor section has a sense gate trench section formed extending from the outside of the active region to the main well region on the front surface of the semiconductor substrate.