Series-Connected Light-Emitting Units With Auxiliary Test Electrodes
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Solution Overview
Problem
Existing semiconductor devices cannot effectively test individual chips in a series connection, leading to potential deterioration or failure of the entire device due to undetected defective chips.
Innovation Solution
A light-emitting device with a substrate, light-emitting units, interconnect structure, first and second electrodes, and an auxiliary electrode structure, allowing for individual testing of each unit by connecting a testing apparatus to specific electrodes and auxiliary electrodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Stress or pressure
If chips are connected in series to divide voltage, then the voltage endurance capability is improved, but the ability to test individual chips deteriorates
Solution Approach 1:
The patent divides the series-connected chip structure into individually accessible units by introducing auxiliary electrode structures that can selectively contact each chip's semiconductor layers. This segmentation allows testing apparatus to access and test individual chips within the series connection, resolving the contradiction between maintaining series voltage division and enabling individual chip testing.
Solution Approach 2:
The auxiliary electrode structures serve as intermediary elements between the testing apparatus and the series-connected chips. These auxiliary electrodes provide additional test access points without disrupting the series connection configuration, enabling individual chip testing while preserving the voltage division capability of the series arrangement.
2Measurement precision
If auxiliary electrode structures are added for individual testing, then the measurement precision is improved, but the device complexity increases
Solution Approach 1:
The auxiliary electrode structure is segmented into multiple independent electrodes, each corresponding to a specific chip position. This segmentation allows for targeted testing of individual chips without requiring complex reconfiguration, simplifying the testing process while maintaining individual chip accessibility.
Solution Approach 2:
The auxiliary electrode structures serve multiple functions: they provide test access points for individual chip testing, maintain electrical connections during testing, and do not interfere with the normal series connection operation. This multi-functionality reduces the need for additional specialized components, thereby limiting the increase in device complexity.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables accurate detection of defective units, reducing the failure rate of semiconductor devices by identifying and isolating faulty components.
Implementation Method 1
Each of the light-emitting units has a light-emitting stack that has a first semiconductor layer, an active layer, and a second semiconductor layer
Data Source
AI summary
A light-emitting device includes a number (N) (not smaller than two) of light-emitting units, a interconnect structure connecting the light-emitting units in series, first and second electrodes, and an auxiliary electrode structure. The light-emitting units each having an light-emitting stack having first and second semiconductor layers of opposite doping types and an active layer. The first and second electrodes are respectively connected to the first semiconductor layer of a first light-emitting unit and the second semiconductor layer of an Nth light-emitting unit. The auxiliary electrode structure is connected to the light-emitting stack of at least one of the light-emitting units.