Shape Memory Alloy Transistor Gate for Nanoscale Memory

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Solution Overview

Problem

Current non-volatile memory technologies face challenges in scalability, reliability, and power efficiency due to limitations in size, energy, and time domains, particularly at the 1-10 nm scale, where charge-based approaches lose dominance and are sensitive to environmental factors, leading to issues with reproducibility and power dissipation.

Innovation Solution

The use of mechanical effects, specifically shape memory alloys and bistable structures, to create a memory device that employs electrostatic or temperature-triggered deformation of a gate in a transistor, allowing for low-power, high-density, and fast nanoscale memory operations by changing the transistor characteristics without relying on charge injection, thus overcoming the limitations of traditional charge-based approaches.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If charge-based memory approaches are used, then memory function is achieved, but scalability is constrained at 1-10 nm dimensions due to leakage and reliability issues

Engineering Contradiction:
Improvememory reliabilityVSAvoiddevice dimension
Core Design Contradiction:
ReliabilityVSLength of moving object

Solution Approach 1:

The patent replaces charge-based memory mechanisms with mechanical shape memory alloy systems. The shape memory alloy gate physically deforms to two stable shapes, creating bistable states through mechanical rather than electrical means, thereby avoiding charge leakage issues at nanoscale dimensions

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The invention changes the fundamental operating parameter from electrical charge to mechanical shape. The shape memory alloy undergoes phase transformation between austenite and martensite phases, creating stable states based on crystal structure rather than charge accumulation, enabling reliable operation at 1-10 nm scales

Inventive Principle:
Principle #35Parameter changes

2Reliability

If floating gate regions with barrier regions are used, then non-volatile storage is achieved, but power consumption increases and scaling to lower dimensions becomes difficult

Engineering Contradiction:
Improvenon-volatile retentionVSAvoidpower consumption
Core Design Contradiction:
ReliabilityVSUse of energy by moving object

Solution Approach 1:

The patent substitutes the electrical field-based charge storage mechanism with a mechanical shape memory system. The shape memory alloy gate maintains its deformed shape through crystalline phase stability rather than electrical barriers, eliminating continuous power requirements for charge maintenance

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The invention utilizes phase transitions in shape memory alloys between austenite and martensite phases to create stable memory states. These phase transitions provide inherent stability without requiring continuous energy input or complex barrier structures, reducing power consumption while maintaining non-volatile retention

Inventive Principle:
Principle #36Phase transitions

3Use of energy by moving object

If fewer electrons are used for storage, then power is reduced and scaling is enabled, but sensitivity to environmental factors increases and reproducibility decreases

Engineering Contradiction:
ImprovepowerVSAvoidreproducibility
Core Design Contradiction:
Use of energy by moving objectVSReliability

Solution Approach 1:

The patent replaces electron-based storage with mechanical shape memory alloy deformation. The macroscopic mechanical properties of the shape memory alloy provide environmental insensitivity and high reproducibility, as the phase transformation behavior is intrinsic to the material and insensitive to individual atom variations or environmental fluctuations

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

Solution Approach 2:

The invention employs shape memory alloy materials with specific compositional control to ensure reproducible phase transformation temperatures and mechanical properties. The composite nature of the shape memory alloy provides both low power operation and high reliability through material-level design rather than relying on precise electron counting

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables a reliable, low-power, and high-speed memory device that can be scaled to the ultimate limits of transistor technology, providing bistable states with improved reproducibility and reduced power dissipation, while maintaining high signal strength and coherence times, thus addressing the constraints of size, energy, and time domains.

Implementation Method 1

a gate made of a shape memory material, and programmed with stress, deformable into two stable positions

Methodology Applied
Scientific EffectShape memory effect: Shape Memory Alloy

Implementation Method 2

a highly compressively stressed film or film stack for the gate

Methodology Applied
Scientific EffectElastic deformation: Elasticity

Data Source

PatentUS8553455B2Shape memory device
Publication Date: 2013.10.08 CORNELL RES FOUNDATION INC
  • US8553455B2 patent drawing
  • US8553455B2 patent drawing
  • US8553455B2 patent drawing

AI summary

Mechanical devices having bistable positions are utilized to form switches and memory devices. The devices are actuatable to different positions and may be coupled to a transistor device in various configurations to provide memory devices. Actuation mechanisms include electrostatic methods and heat. In one form, the mechanical device forms a gate for a field effect transistor. In a further form, the device may be a switch that may be coupled to the transistor in various manners to affect its electrical characteristics when on and off. The memory switch in one embodiment comprises side walls formed with tensile or compressive films. A cross point switch is formed from a plurality of intersecting conductive rows and columns of conductors. Actuatable switches are positioned between each intersection of the rows and columns such that each intersection is independently addressable.