Shared Optical Path 2D/3D Measurement for Fast Inline Imaging
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Solution Overview
Problem
Existing 3D image capture methods for inline measurements face challenges in achieving high measurement speed, resolution, and accuracy while maintaining a compact size and cost-effectiveness, often suffering from mechanical interference and limited dynamic range due to separate optical paths for 2D and 3D image capture.
Innovation Solution
A measurement apparatus using a combined optical setup with a single light source and imaging lens for both 2D and 3D image capture, reducing the intensity of reference light on the 2D image sensor in 2D mode, allowing for a compact design and fast switching between modes, and utilizing shared optical elements for improved accuracy and throughput.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate optical paths are used for 2D and 3D image capture, then each mode can be optimized independently, but the device complexity increases and mechanical interference occurs
Solution Approach 1:
The patent combines separate optical paths for 2D and 3D image capture into a single shared optical path. The same imaging lens and light source are used for both modes, eliminating mechanical interference and reducing device complexity while maintaining measurement precision through software-based mode separation
Solution Approach 2:
The imaging lens and light source are designed to serve multiple functions - they can operate in both 2D image capture mode and 3D image capture mode. This multi-functionality eliminates the need for separate optical components, reducing overall device complexity while preserving the measurement capabilities of both modes
2Device complexity
If a single optical path is used for both 2D and 3D capture, then device complexity is reduced, but mechanical interference and offset errors occur
Solution Approach 1:
The patent segments the measurement process into distinct 2D and 3D capture modes that are software-controlled. By separating the measurement logic into different operational modes with distinct processing paths, the system eliminates mechanical interference while maintaining measurement accuracy through consistent optical alignment
Solution Approach 2:
The patent creates a virtual copy of the optical path through software control. By using the same physical optical components for both modes but separating them logically through control signals, the system maintains measurement accuracy without requiring separate physical paths, thus avoiding mechanical interference
3Measurement precision
If high-resolution 2D and 3D image capture is implemented, then measurement accuracy improves, but the assembly volume increases
Solution Approach 1:
The patent merges the optical components for 2D and 3D capture into a single compact assembly. By sharing the imaging lens and light source, the overall assembly volume is significantly reduced compared to having separate optical paths, while still achieving high-resolution images in both modes through optimized software processing
4Productivity
If fast switching between 2D and 3D modes is enabled, then productivity increases, but mechanical reconfiguration time is required
Solution Approach 1:
The patent replaces mechanical reconfiguration with electronic control for mode switching. By using software control signals to switch between 2D and 3D capture modes rather than mechanical adjustments, the switching time is dramatically reduced, enabling fast mode changes that significantly improve productivity
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The solution enables high-resolution 2D and 3D image capture with reduced mechanical interference, enabling fast inline measurements with high accuracy and reduced production costs, suitable for manufacturing and inspection systems.
Implementation Method 1
a light source (500) configured and arranged to, in use, emit an illumination light beam (520) onto the common region (950), and to emit a reference light beam (510) onto the second image sensor (300)
Implementation Method 2
an imaging lens (800) configured and arranged to direct and focus at least a portion of the measurement light beam (530) onto the first image sensor (200) and onto the second image sensor (300); and to direct and focus at least a portion of the reference light beam (510) onto the second image sensor (300)
Implementation Method 3
the measurement apparatus (100) is configured and arranged to substantially reduce the intensity of the reference light beam (510) received at the first image sensor (200) when operating in a 2D image capture mode
Data Source
AI summary
Measurement apparatus (100, 101, 102) that is also suitable for a manufacturing or inspection system, comprising a light source (500) for emitting an illumination light beam (520) and a reference light beam (510), an imaging lens (800) that directs measurement light (530) and reference light (510) onto a 2 D image sensor (200) and a 3D image sensor (300), wherein the measurement apparatus (100) is configured to substantially reduce the intensity of the reference light (510) incident on the 2D image sensor (200) if it is operating in a 2D imaging mode.