Shared Testing Contact Electrodes for Array Substrate TEG
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The existing testing methods for display panels require a large number of testing contact electrodes, leading to high testing costs and significant space occupation on the array substrate, as each element to be tested corresponds to multiple independent contact electrodes.
Innovation Solution
The array substrate design includes a Testing Element Group (TEG) where at least one testing contact electrode is shared by multiple to-be-tested elements, reducing the number of required contact electrodes and optimizing their arrangement to minimize space usage, with shared electrodes made of identical materials to simplify manufacturing and testing processes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If each to-be-tested element is connected to multiple independent testing contact electrodes, then testing reliability is improved, but the number of testing contact electrodes increases, leading to increased testing cost and space occupation
Solution Approach 1:
The patent merges the function of multiple testing contact electrodes into a shared electrode structure. Specifically, a first testing contact electrode is shared by multiple first TFTs, and a second testing contact electrode is shared by multiple second TFTs. This combining approach reduces the total number of testing contact electrodes while maintaining the ability to test multiple elements, thereby resolving the contradiction between testing reliability and the quantity of electrodes required
Solution Approach 2:
The shared testing contact electrodes serve multiple functions by being connected to multiple to-be-tested elements simultaneously. The first testing contact electrode functions as a common contact for all first TFTs, and the second testing contact electrode serves all second TFTs. This multi-functionality allows a single electrode to replace what would traditionally require multiple separate electrodes, reducing electrode quantity while preserving testing capability
2Measurement precision
If multiple independent testing contact electrodes are used for each to-be-tested element, then testing accuracy is maintained, but the space occupied by the TEG increases
Solution Approach 1:
By merging multiple testing contact electrodes into shared electrodes that serve multiple TFTs simultaneously, the physical space required for the TEG is significantly reduced. The shared electrode structure consolidates what would be separate electrode placements into a more compact arrangement, maintaining testing accuracy while minimizing the area occupied by the testing element group
Solution Approach 2:
The patent optimizes the spatial arrangement of testing contact electrodes by configuring them in a compact pattern where shared electrodes are positioned to serve multiple TFTs in a space-efficient manner. This dimensional optimization allows the TEG to occupy less area on the array substrate while still providing accurate testing pathways to all necessary elements
3Adaptability or versatility
If a large number of testing contact electrodes are arranged on the array substrate, then comprehensive testing coverage is achieved, but the device complexity increases
Solution Approach 1:
The shared testing contact electrodes provide universal access points that can test multiple different TFT elements through a single electrode interface. This universality simplifies the overall electrode arrangement by reducing the number of unique electrode connections needed, thereby decreasing device complexity while maintaining comprehensive testing coverage across all TFT elements
Solution Approach 2:
The patent segments the TFT array into groups (first TFTs and second TFTs) that can be tested through dedicated shared electrodes. This segmentation strategy organizes the testing structure in a systematic way that reduces complexity compared to a fully independent electrode arrangement for each TFT, while still achieving complete testing coverage
Data Source
AI summary
The present disclosure provides an array substrate, its manufacturing method and testing method, and a display device. The array substrate includes a (Test Element Group) TEG arranged at a non-display area and including a plurality of to-be-tested elements and a plurality of testing contact electrodes configured to test the to-be-tested elements. Each of the to-be-tested elements is connected to at least two of the testing contact electrodes, and at least one of the testing contact electrodes is shared by at least two of the to-be-tested elements.