SiC Wafer Support Arms for Complete Molten Silicon Drainage

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Solution Overview

Problem

The existing methods for fabricating silicon carbide (SiC) wafers face issues with melted silicon sticking to the support due to surface tension, leading to incomplete drainage and inefficiencies in the fabrication process.

Innovation Solution

The apparatus includes a support with a plurality of arms that minimizes physical contact with the substrate, reducing surface tension and allowing the molten silicon to drain effectively into a receptacle, while a method involving hetero- and homo-epitaxy is used to form SiC layers, with temperature control and etching processes to separate the silicon substrate from the SiC layer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If the substrate is placed directly on the support for fabrication, then the support provides stable positioning, but the molten silicon sticks to the support due to surface tension, causing incomplete drainage

Engineering Contradiction:
Improvestable positioningVSAvoidincomplete drainage of molten silicon
Core Design Contradiction:
ReliabilityVSLoss of substance

Solution Approach 1:

The support is divided into multiple arms that are spaced apart, creating gaps between them. This segmentation reduces the continuous contact area between the substrate and support, minimizing surface tension effects and allowing molten silicon to drain more completely through the gaps into the receptacle below.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The arms of the support act as intermediaries that provide positioning functionality while minimizing harmful contact. By using discrete arms rather than a continuous support surface, the system mediates between the need for stable positioning and the need to reduce surface tension adhesion of molten silicon.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Stability of the object's composition

If the support has extensive contact with the substrate, then positioning is stable, but surface tension causes molten material to cling to the support

Engineering Contradiction:
Improvepositioning stabilityVSAvoidsurface tension adhesion
Core Design Contradiction:
Stability of the object's compositionVSObject-generated harmful factors

Solution Approach 1:

The support structure is segmented into multiple discrete arms rather than a continuous surface. This segmentation maintains positioning stability through distributed contact points while reducing the total contact area, thereby minimizing surface tension adhesion of molten silicon to the support.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The support provides localized contact only at the arm positions rather than continuous contact. This local quality approach concentrates the necessary positioning function at specific points while leaving other areas free of contact, reducing overall surface tension effects on the molten material.

Inventive Principle:
Principle #3Local quality

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This approach ensures efficient separation and formation of SiC wafers by reducing the likelihood of molten silicon clinging to the support, allowing for complete drainage and precise control over layer growth, thereby improving the fabrication process.

Implementation Method 1

heating the reaction chamber to a temperature that is higher than the first melting temperature and lower than the second melting temperature such that the silicon substrate begins to melt

Methodology Applied
Scientific EffectMelting: Melting

Implementation Method 2

surface tension between the arms and molten material is reduced, and the molten material will be less likely to cling to the support, itself

Methodology Applied
Scientific EffectSurface tension: Surface Tension

Implementation Method 3

forming a first layer of silicon carbide on the silicon substrate by exposing the silicon substrate to a flow of precursors (i.e., hetero-epitaxy)

Methodology Applied
Scientific EffectEpitaxy: Epitaxy

Implementation Method 4

exposed to a flow of precursors to form a second layer of silicon carbide (i.e., homo-epitaxy)

Methodology Applied
Scientific EffectChemical Vapor Deposition: Chemical Vapour Deposition

Implementation Method 5

any remaining portions of the silicon substrate coupled to the first layer of silicon carbide is removed by an etching process

Methodology Applied
Scientific EffectEtching:

Data Source

PatentUS11830724B2Apparatus and method for manufacturing a wafer
Publication Date: 2023.11.28 STMICROELECTRONICS SRL
  • US11830724B2 patent drawing
  • US11830724B2 patent drawing
  • US11830724B2 patent drawing

AI summary

Various embodiments provide an apparatus and method for fabricating a wafer, such as a SiC wafer. The apparatus includes a support having a plurality of arms for supporting a substrate. The arms allows for physical contact between the support and the substrate to be minimized. As a result, when the substrate is melted, surface tension between the arms and molten material is reduced, and the molten material will be less likely to cling to the support.