Signal-and-Reference Probe with Shielded, Isolated Contact Pin
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Solution Overview
Problem
Existing probes for measuring signal and reference signals require matching contact interfaces with the device under test, leading to potential errors and less accurate measurements due to varying orientations and dimensions, and electromagnetic shielding issues.
Innovation Solution
A probe design with a pin having an abutting surface for contact, electrically isolated from the metal body, ensuring electromagnetic shielding while maintaining electrical isolation, and a movably located pin for precise contact, using a spring mechanism for stable engagement.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a signal socket with concavity is used to receive the signal pin, then the probe can establish electrical contact with the device under test, but the contact interface must match the device interface precisely, requiring adapters when interfaces differ, which introduces measurement errors
Solution Approach 1:
Instead of using a socket that receives a pin (conventional approach), the patent inverts the design by using a pin with an abutting surface that actively contacts the device interface. This inversion eliminates the need for precise socket-concavity matching and allows the probe to adapt to various device interfaces without requiring adapters, thereby improving both measurement accuracy and interface compatibility
2Object-affected harmful factors
If the signal socket and reference contact are electromagnetically shielded by a metal body, then electromagnetic interference is reduced, but the shielding may not be sufficient for high-precision measurements, causing less accurate measurement results
Solution Approach 1:
The patent extracts the signal reception function from the shielded socket structure and places it on a separate pin that is electrically isolated from the metal body. This separation allows the pin to contact the device interface without being constrained by the shielding structure, enabling better electromagnetic compatibility while maintaining measurement precision through proper electrical isolation
3Measurement precision
If input capacitances at the probe tip are standardized, then common-mode rejection ratio measurements can be performed accurately, but the probe design becomes more complex to ensure precise capacitance matching
Solution Approach 1:
The pin with abutting surface is designed to be movably located within the probe body, allowing it to automatically adjust its position during contact with the device interface. This self-adjusting mechanism simplifies the overall probe structure while ensuring consistent electrical contact and controlled input capacitance, thereby enabling accurate CMRR measurements without complex capacitance matching designs
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Ensures accurate and reliable signal measurement across varying device interfaces with reduced interference, allowing for high-voltage differential probing and easy adaptation to different devices.
Implementation Method 1
The pin is located within the metal body such that the pin and its abutting surface is electromagnetically shielded by the metal body that acts as the shielding
Implementation Method 2
The pin is movably located in the probe such that the pin has an initial state and a pushed state into which the pin is pushed
Data Source
AI summary
Embodiments of the present disclosure relate to a probe for measuring a signal and a reference signal. The probe comprises a metal body that encompasses a reference socket. The reference socket is in electrical connection with the metal body for measuring the reference signal. The probe comprises a pin that is arranged electrically isolated from the metal body. The pin has an abutting surface capable of contacting a device under test. Further, embodiments of the present disclosure relate to a method of manufacturing a probe for measuring a signal and a reference signal.