Single-Layer X-Ray Detector Flux Adaptation
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Solution Overview
Problem
Existing X-ray CT apparatuses require multiple semiconductor layers to handle high X-ray flux rates, leading to high manufacturing costs and complexity due to the need for sophisticated manufacturing technology and precision equipment.
Innovation Solution
An X-ray detector with a single-layered semiconductor substrate that uses both photon counting and current measuring modes to adapt to low to high flux rates, allowing data collection without saturation, utilizing a common electrode and individual electrodes arranged on the semiconductor substrate for efficient data collection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If multiple semiconductor layers are provided to raise the saturation limit for high flux rates, then the saturation limit is improved, but the device complexity and manufacturing cost increase
Solution Approach 1:
The patent implements dynamic switching between photon counting mode and current measuring mode based on the incident X-ray flux rate. The control unit automatically selects the appropriate detection mode, allowing a single semiconductor layer to adaptively handle both low flux rates (photon counting) and high flux rates (current measuring), eliminating the need for multiple fixed-thickness layers while maintaining the saturation limit across varying conditions.
2Adaptability or versatility
If multiple semiconductor layers are provided to handle high flux rates, then the adaptability to high flux rates is improved, but the manufacturing cost increases due to sophisticated manufacturing technology and precision equipment
Solution Approach 1:
The patent makes a single semiconductor layer perform multiple functions by implementing both photon counting mode and current measuring mode. The same semiconductor substrate can detect low flux rates through photon counting and high flux rates through current measuring, with the control unit switching between modes as needed. This multi-functionality eliminates the need for multiple specialized layers, significantly reducing manufacturing complexity and cost while maintaining adaptability across the full flux rate range.
3Measurement precision
If photon counting mode is used for high flux rates, then the measurement precision is improved, but the detection saturation occurs
Solution Approach 1:
The system dynamically switches between detection modes based on the incident flux rate. When the flux rate is low, photon counting mode is used for high measurement precision. When the flux rate increases and approaches saturation levels, the control unit automatically switches to current measuring mode, which has a higher linear range and does not saturate as easily. This dynamic adaptation ensures both measurement precision and reliability across all flux rate conditions.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables adaptable X-ray detection across a wide flux range without saturation, reducing manufacturing costs and simplifying the configuration, while allowing for precise visualization of elemental distribution and X-ray absorption coefficients in images.
Implementation Method 1
a semiconductor which directly converts photons of X-rays into electrical signals
Data Source
AI summary
An X-ray detector includes a single-layered semiconductor substrate having an array of detection cells which directly convert photons of X-rays into electrical signals; a first data collecting device which collects data with respect to the array of detection cells in a photon counting mode; and a second data collecting device which collects data with respect to the array of detection cells in a current measuring mode.