Material Analysis Using Wave/Particle Radiation TRIZ Cases

A flexible steerable housing inserts an x-ray source and detector into pipes to identify lead presence, eliminating costly excavation.

A charged particle beam apparatus adjusts the aperture center axis using spot pattern analysis to correct off-axis aberration.

Selective pixel extraction reduces data processing time while maintaining measurement precision for submicron semiconductor features.

A pulse neutron backscatter device detects scattered neutrons to identify internal defects without inner-side access.

A material sorting system combines machine learning vision with x-ray fluorescence to classify mixed recyclables.

A sports ball sterilizer uses ultraviolet germicidal irradiation to destroy pathogens on ball surfaces.

A method constructs three-dimensional images by rotating the sample about a perpendicular axis and tilting it in increments.

An electromagnetic wave inspection system detects prohibited objects and guides individuals to specific paths.

Transforming defect swath coordinates to a common reticle instance reference reduces false repeater detection caused by location discrepancies.

Monochromatic X-rays strike a semiconductor device at an oblique angle to generate diffraction images for stress distribution mapping.

Inter-coaxial HPGe detector configuration segments depletion zones to enable efficient charge collection across large crystal volumes.

Stacked flat Bragg diffractors resolve spectral overlap issues by enabling concurrent measurement of multiple x-ray energies.

Computational synthesis of parallel projections from 3D CT volumes eliminates the need for large dedicated cephalometric x-ray equipment.

Periodic voltage switching synchronizes high and low energy data acquisition at identical anatomical positions, eliminating mis-registration artifacts.

An aluminum and magnesium covering layer suppresses capacity reduction during charge cycles to maintain high battery reliability.

A radiolucent fixture secures components for computed tomography scanning using vibration-dampening material and fasteners.

A probe tip extracts semiconductor defects from substrates for independent chemical analysis.

Curved surface residual stress measurement uses X-ray diffraction with sin2 Psi analysis to correct geometric errors from material shape.

Integrating a Rogowski coil enables synchronized photon and charged particle detection without detector saturation.

A movable radiation source and detector adjust distance along a flexible axis to capture images in non-horizontal orientations.

A wavelength-dispersive X-ray analyzer uses temperature sensors to trigger automatic recalibration of the spectrometer.

A charged-particle microscope records electron kinetic energy spectra and uses computer processing to spatially resolve data into discrete depth levels.

A CT image processing unit separates target regions by evaluating voxel CT values to enable precise three-dimensional measurement.

X-ray diffraction measures lattice shifts under electric fields to determine piezoelectric coefficients without sample polishing.

A movable x-ray detector system captures multiple image copies along dynamic scan paths to reconstruct high-resolution data.

Segmented detection modules form a spherical cavity to capture true coincidence events, resolving sensitivity drop-off at detector ends.

A sample holder design monitors electron beam dose to detect film damage during inspection.

Segmenting angular ranges into discrete acquisition portions reduces unsampled regions and eliminates reconstruction artifacts in computed tomography.

Parallel X-ray beam diffracts on crystal lattice to detect phase composition, reducing scattering noise and enabling effective process control.

A rotating mirror unit synchronizes with a multi-color filter wheel to direct sequential light beams to a single optical detector.

Predictive sum peak removal corrects excessive or insufficient subtraction errors in X-ray fluorescence analysis profiles.

A single-layer semiconductor substrate switches between photon counting and current measuring modes to handle varying X-ray flux rates.

A particle beam microscopy system cleans vacuum chamber surfaces by supplying precursor gas and activating it with ultraviolet radiation to generate reactive ozone.

A control device adjusts helical pitch and channel-direction filtering to maintain image quality when X-ray tube current is limited.

An array of isolated high-Z nuggets on a low-Z substrate enables selective activation, extending target lifespan and reducing calibration downtime.

A photon count detector captures projection data and energy information to reconstruct 3D material composition.

A resonant control circuit drives an electron beam manipulation coil to generate stable magnetic fields for precise beam deflection.

A dual source x-ray fluorescence system uses sequential excitation to resolve sulfur interference masking low concentration elements.

Hierarchical modeling segments rectal tubes using dynamic programming to reduce false positives from rigid template matching.

A radiation diagnostic apparatus alternates X-ray energy levels to generate dual energy subtraction images.

A photoacoustic sensor uses optical detection to measure resonance body vibrations without electrical contact.

An x-ray interrogation system uses an array of high-resolution micro-beams to illuminate objects simultaneously.

A guide wheel rolls along the periphery of a rotatable structure to enable linear translation and locking.

A secondary charged particle beam manages surface charging during inter-line intervals to prevent distortion and enhance image contrast.

Rotating gantry plenum air movers expel conditioned air through material-free regions to stabilize component temperatures.

Adjustable filter segments move dynamically in front of the detector array to optimize x-ray flux distribution and improve image fidelity.

Oriented active shape model combines live wire cost functions with dynamic programming to resolve automation precision trade-offs in medical image segmentation.

Dynamic current adjustment ensures uniform sterilization dose while exhaust manifolds prevent sterilant damage to the emitter window.

A multi-layer thickness measurement method combines fluorescent and transmitted X-ray detection to calculate individual layer dimensions.

X-ray fluorescence imaging system using nanoparticles to detect small tumors with high sensitivity.