X-ray Interrogation System Using Multiple Micro-beams
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Solution Overview
Problem
Current x-ray techniques struggle to effectively investigate larger surfaces and volumes of objects using multiple beams, as they lack the ability to identify and separate signals from individual beams, making it impractical for high-resolution analysis.
Innovation Solution
An x-ray interrogation system utilizing an array of high-resolution x-ray micro-beams, either from a structured source or a Talbot Interference pattern, which allows for spatially resolved fluorescence and diffraction analysis by aligning detectors to capture signals from individual micro-beams, enabling high-resolution imaging and faster data acquisition.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If multiple x-ray beams are used to interrogate larger surfaces and volumes, then the coverage area and analysis speed are improved, but the ability to identify and separate signals from individual beams deteriorates
Solution Approach 1:
The system segments the x-ray beam into multiple spatially separated micro-beams that illuminate different locations on the object simultaneously. Each micro-beam's signal can be independently detected and identified through spatial encoding, allowing multiple locations to be analyzed at once while maintaining signal distinguishability. This resolves the contradiction by enabling large area coverage through multiple beams while preserving the ability to identify individual beam signals through spatial separation and encoding.
Solution Approach 2:
The patent introduces an intermediary encoding mechanism that tags or identifies each micro-beam's signal with its spatial origin information. This intermediary encoding layer allows the detection system to distinguish which signal came from which micro-beam, even when multiple beams are used simultaneously to cover large areas. The encoding acts as a mediator between the multiple beams and the detector, solving the signal identification problem.
2Productivity
If multiple x-ray beams are used to increase throughput, then the data acquisition speed is improved, but the system complexity increases
Solution Approach 1:
The system divides the x-ray beam into multiple micro-beams using segmentation techniques, allowing simultaneous interrogation of multiple locations. This segmentation enables faster data acquisition through parallel measurement while using relatively simple beam-splitting optics and detector arrays, avoiding the need for complex multi-source systems. The segmentation approach achieves high throughput with manageable system complexity.
Solution Approach 2:
The patent combines multiple micro-beam signals into a single detection system that can process all signals simultaneously. By merging the detection of multiple beams into one integrated detector array with spatial encoding capability, the system achieves high throughput without requiring separate detection systems for each beam, thereby controlling overall system complexity while maintaining fast data acquisition.
3Measurement precision
If high-resolution micro-beams are used, then the measurement precision is improved, but the coverage area is reduced
Solution Approach 1:
The system segments the illumination area into multiple high-resolution micro-beam spots distributed across the object surface. Each micro-beam maintains high spatial resolution for precise local measurement, while the collective array of micro-beams covers a large total area. This segmentation allows simultaneous high-resolution analysis at multiple locations, resolving the contradiction between resolution and coverage area.
Solution Approach 2:
The patent transitions from single-point high-resolution analysis to a two-dimensional array of micro-beam spots. By distributing high-resolution micro-beams across the object surface in multiple dimensions, the system achieves both high measurement precision at each spot and large overall coverage area through the extended spatial distribution of the micro-beam array.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enables high-resolution, high-throughput analysis of objects by allowing simultaneous acquisition of x-rays from multiple small-diameter microbeams, achieving enhanced signal-to-noise ratios and faster tomographic analysis, with the ability to map micron-scale properties and perform 3D volume mapping.
Implementation Method 1
an x-ray source may illuminate a 'beam splitting' grating that produces a set of self-replicating beams in space called a 'Talbot Interference pattern'
Implementation Method 2
x-ray fluorescence (XRF) analyze the elements present in an object
Implementation Method 3
x-ray diffraction to analyze internal structures of an object
Data Source
AI summary
An x-ray interrogation system having one or more x-ray beams interrogates an object (i.e., object). A structured source producing an array of x-ray micro-sources can be imaged onto the object. Each of the one or more beams may have a high resolution, such as for example a diameter of about 15 microns or less, at the surface of the object. The illuminating one or more micro-beams can be high resolution in one dimension and/or two dimensions, and can be directed at the object to illuminate the object. The incident beam that illuminates the object has an energy that is greater than the x-ray fluorescence energy.