X-ray Fluorescence Analyzer Sum Peak Removal
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Solution Overview
Problem
Conventional methods for removing sum peaks from X-ray fluorescence analyzer results often result in either excessive or insufficient removal, failing to accurately correct the analysis profiles.
Innovation Solution
An X-ray fluorescence analyzer and data processing method that calculates a predictive value for sum peaks using count values and energy values of characteristic X-rays, allowing for precise subtraction from the initial spectrum to remove sum peaks effectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional methods are used to remove sum peaks, then sum peak removal processing is performed, but the removal is either excessive or insufficient leading to inaccurate analysis results
Solution Approach 1:
The patent changes the parameter used for sum peak removal from fixed count rate and peaking time to a predictive value based on the relationship between count values and energy values of characteristic X-rays. This parameter change enables dynamic adaptation to different spectral conditions, achieving accurate sum peak removal without excessive or insufficient subtraction.
Solution Approach 2:
The patent implements feedback by calculating predictive values for each element based on their characteristic X-ray energy values and count values, then using these predictive values to guide the sum peak removal process. This feedback mechanism ensures that sum peaks are removed accurately according to the actual spectral characteristics rather than using fixed parameters.
2Ease of operation
If sum peaks are removed using fixed count rate and peaking time, then processing is simplified, but accuracy deteriorates due to excessive or insufficient removal
Solution Approach 1:
The system performs self-service by automatically calculating predictive values for each element based on their own characteristic X-ray energy values and count values. This self-service mechanism eliminates the need for manual parameter adjustment while maintaining high precision in sum peak removal, as each element's sum peaks are removed based on its specific characteristics.
3Measurement precision
If predictive values are calculated for each element, then sum peak removal accuracy is improved, but processing complexity increases
Solution Approach 1:
The patent applies segmentation by dividing the sum peak removal process into element-specific steps. Each element's sum peaks are calculated and removed separately based on their characteristic energy values and count values. This segmentation approach maintains high precision while organizing the complex processing into manageable, systematic steps that can be executed automatically.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method enables appropriate removal of sum peaks, improving the accuracy of analysis results by reflecting energy dependence and reducing deviations in the spectrum, thus enhancing the reliability of elemental analysis.
Implementation Method 1
an X-ray detector configured to detect X-rays of a sample
Data Source
AI summary
A method of processing an initial spectrum of a sample acquired by processing an output of an X-ray detector is provided. A processor calculates a predictive value of a count value forming sum peaks, for each of one or more elements constituting the sample, using a count value and a value of energy of characteristic X-rays in the initial spectrum energy and subtract the predictive value calculated for each of the one or more elements constituting the sample from the count value of the initial spectrum to remove the sum peaks from the initial spectrum.