Single-Sided Clamping Mechanism for TEM Sample Holder Tips
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional sample holders in charged particle microscopes are limited by sub-optimal manipulability, requiring special tools and not being able to clamp the full perimeter of the sample, which complicates operations like ion milling and surface modification, especially for delicate and thin samples.
Innovation Solution
A sample holder tip with a clamping mechanism where the clamping arms are integrated with the sample receiving zone and moveable from a single side, allowing for easy loading and secure clamping without loose parts, maximizing sample visibility and providing a high clamping force.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If conventional sample holders with separate clamping plates are used, then the sample can be clamped, but the device complexity increases and special tools are required for operation
Solution Approach 1:
The clamping mechanism is integrated directly into the sample holder body, merging the clamping function with the holder structure. This eliminates separate clamping plates and special tooling requirements, allowing standard tweezers to be used for sample loading while maintaining secure clamping capability.
2Shape
If clamping plates are positioned on both sides of the sample, then the sample is securely clamped, but the external profile increases and sample visibility is reduced
Solution Approach 1:
The clamping mechanism is positioned asymmetrically on only one side of the sample holder, rather than symmetrically on both sides. This asymmetric configuration reduces the external profile and minimizes shadowing of the sample, improving visibility while maintaining adequate clamping force through the single-sided design.
3Adaptability or versatility
If conventional clamping mechanisms are used, then the sample can be held, but additional tools and spacers are needed for delicate and thin samples
Solution Approach 1:
The integrated clamping mechanism is designed to be universally applicable to various sample types including delicate and thin samples, eliminating the need for specialized tools or spacers. The mechanism provides adjustable clamping force and accommodates different sample geometries through its integrated design, making the sample holder versatile for multiple applications.
Data Source
AI summary
The invention relates to a sample holder tip for use in a charged particle microscope, such as a transmission electron microscope; a sample holder comprising said sample holder tip and methods of using said sample holder tip and sample holder.