Small-Pitch Probe Pin Retrieval Using Controlled Bending
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Solution Overview
Problem
The assembly and retrieval of small-pitch probe pins in probe heads is challenging due to the reduced pitches of contact pads, leading to difficulties in probe pin reuse and reassembly.
Innovation Solution
A method involving a bending fixture to mitigate probe pin deformation by adjusting the bending delta, allowing for easy retrieval and reassembly of probe pins using a carrier, plate, and arm system.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If pitch of probe pins is reduced to match reduced contact pad pitch, then probe card can test smaller features, but assembly and retrieval of probe pins becomes difficult
Solution Approach 1:
A bending fixture is introduced as an intermediary tool between the probe pin and the operator. This fixture provides controlled bending points and leverage arms that enable precise manipulation of small-pitch probe pins without requiring direct manual handling, thus resolving the contradiction between reduced pitch and ease of assembly/retrieval
Solution Approach 2:
The bending fixture is designed to allow the probe pin to bend and return to its original position through controlled elastic deformation. The probe pin's own elasticity serves the function of both bending during assembly and self-returning during retrieval, eliminating the need for complex mechanical retrieval mechanisms
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Facilitates the efficient retrieval and re-use of probe pins by reducing deformation, thereby improving the re-use rate and ease of assembly into new probe heads.
Implementation Method 1
A first bending delta between a pin tip of the probe pin and a pin head of the probe pin is obtained. The probe pin is bent by a bending fixture when the first bending delta is greater than a value to obtain a second bending delta between the pin tip and the pin head.
Data Source
AI summary
A method for re-using a probe pin includes following operations. A first probe head including an upper die, a lower die, and at least a probe pin is received. A first bending delta between a pin tip and a pin head of the probe pin is compared with a value. The probe pin is bended to obtain a second bending delta when the first bending delta is greater than the value. The probe pin is pushed in a first direction from the lower die to the upper die after the bending of the probe pin, or when the first bending delta is less than the value. The probe pin is retrieved from the first probe head, and assembled to a second probe head. A third bending delta of the probe pin in the second probe head is less than the first bending delta.