SoC Monitoring Circuit BIST for Voltage Fault Detection
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Solution Overview
Problem
The integration of semiconductor devices has increased, leading to higher failure likelihoods, and conventional testing methods for system-on-chip (SoC) are inefficient due to limited channels and accessibility issues, particularly for built-in memory devices, necessitating improved testing methods.
Innovation Solution
Incorporation of a built-in self-test (BIST) circuit within the SoC to accurately determine the normal operation of monitoring circuits by checking supply and reference voltages, as well as comparator offsets, using multiple test circuits to ensure the monitoring voltage falls within specified ranges.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If conventional testing methods are used for SoC, then testing can be performed with existing equipment, but testing efficiency is low due to limited channels and accessibility issues
Solution Approach 1:
The patent merges the test circuit functionality directly into the monitoring circuit structure by integrating test voltage generation units, test current generation units, and test signal output units within the existing monitoring circuit blocks. This integration eliminates the need for separate external test equipment and channels, thereby improving testing efficiency without requiring additional complex external testing infrastructure.
Solution Approach 2:
The monitoring circuit performs self-testing through built-in test units that generate test voltages and currents to verify the operational status of internal components. The test signal output unit autonomously outputs test results without requiring external test equipment, enabling the circuit to service its own testing needs and improving productivity while maintaining manageable device complexity.
2Reliability
If monitoring circuit accuracy is improved by adding more test circuits, then reliability of monitoring voltage detection increases, but device complexity increases
Solution Approach 1:
The test voltage generation unit and test current generation unit are designed to serve multiple functions: they generate test signals for verifying operational status, provide reference voltages for comparison, and enable various types of fault detection within the monitoring circuit. This multi-functionality improves reliability through comprehensive testing while avoiding the need for separate dedicated test components for each function, thereby controlling device complexity.
Solution Approach 2:
The monitoring circuit is segmented into functional modules including test voltage generation units, test current generation units, operational status verification units, and test signal output units. Each module performs a specific testing function, which improves reliability through modular verification while keeping individual module complexity manageable. The segmentation allows systematic testing without requiring a monolithic complex test structure.
Data Source
AI summary
A system-on-chip (SoC) includes a monitoring circuit configured to determine whether a monitoring voltage has a value between a first reference voltage and a second reference voltage using a first supply voltage and a second supply voltage, and a built-in self-test (BIST) circuit configured to, in response to an enable signal, determine whether the monitoring circuit is operating normally. The BIST circuit may include a first test circuit configured to determine whether the first supply voltage has a value within a predetermined first supply range using the second supply voltage, a second test circuit configured to determine whether the first reference voltage has a value within a predetermined first reference range, and a third test circuit configured to determine whether the monitoring circuit compares a magnitude of the monitoring voltage with a magnitude of a first determination voltage having a value within a predetermined first comparison range from the first reference voltage.