Electronic Circuit Testing TRIZ Cases
- Semiconductor Chip Testing with Direct Defect Retesting
A loading set plate sends defective chips directly to retesting, reducing transfers and overall semiconductor test time.
- Semiconductor Testing Socket With Adjustable Support for BGA and LGA
A movable height-adjusting mechanism adapts the socket's support surface for BGA and LGA packages without replacement.
- Ceramic Substrate Crack Detection with Closed-Loop Wiring
Segmented detecting wires form closed loops around the installation area to localize ceramic substrate cracks with greater reliability.
- Probe Head Guide-Plate Routing for Loopback Signal Integrity
A probe head routes loopback signals through guide-plate traces between probe pins, shortening paths and improving test signal integrity.
- Pre-Co-Packaging Optoelectronic IC Testing Via Interposer
A stacked jig, optical assemblies, and interposer enable pre-packaging electrical tests, helping improve yield and avoid defective final assemblies.
- SoC Monitoring Circuit BIST for Voltage Fault Detection
This SoC BIST architecture verifies monitoring circuits by testing supply and reference ranges plus comparator offsets.
- Transistor Circuit Inspection Using Automated Electrical Standards
The inspection circuitry calculates electrical standards from transistor specifications and flags current-voltage data outside them.
- Clockless, Calibration-Less Differential Aging Monitor for Noise Resilience
A sensor-reference count difference enables clockless, calibration-free aging detection.
- Low-Temperature Chip Testing Module With Anti-Condensation Dry Gas
Conductive and convective cooling combine with a communicating pipe to keep chip sockets cold and dry without a large testing chamber.
- Gridded Ion Thruster Electrical Emulator for Earth-Based Power Testing
This equivalent circuit mimics a gridded ion thruster, letting engineers test its power supply assembly under ambient conditions.