Transistor Circuit Inspection Using Automated Electrical Standards
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Solution Overview
Problem
Existing methods for inspecting the operation of circuits with transistors require significant manual effort and risk inaccuracies due to operator input, especially when determining safe operating areas.
Innovation Solution
An inspection device and method that includes a standard calculating circuitry to automatically determine an electrical standard based on transistor specifications and a standard determining circuitry to assess whether inspection data meets this standard, reducing manual input and ensuring accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If manual inspection method is used, then inspection flexibility is maintained, but workload increases and accuracy decreases
Solution Approach 1:
The inspection device automatically calculates the safe operating area based on transistor specifications without requiring operator intervention. The device serves itself by autonomously determining inspection standards and comparing them against measured data, eliminating the need for manual input while maintaining inspection accuracy.
Solution Approach 2:
The patent replaces manual mechanical inspection processes with automated computer-based evaluation. The inspection device uses computational algorithms to calculate safe operating areas and compare them against measured current-voltage data, substituting human judgment with automated electronic processing.
2Productivity
If automatic inspection method is used, then productivity increases, but risk of inaccuracy increases due to operator input
Solution Approach 1:
The inspection device automatically generates inspection standards by reading transistor specifications from data sheets or databases. It autonomously performs the entire inspection process without requiring operator input for standard calculation, thereby maintaining both high productivity and accuracy by eliminating human error in the automated process.
3Adaptability or versatility
If manual standard setting is used, then adaptability to different transistors is maintained, but time consumption increases
Solution Approach 1:
The inspection device pre-calculates safe operating areas based on standard transistor specifications stored in databases. When a new transistor type is inspected, the device automatically retrieves relevant specifications and calculates appropriate standards without requiring manual adjustment, thereby maintaining adaptability while eliminating time-consuming standard setting procedures.
Solution Approach 2:
The device adapts to different transistor types by automatically adjusting inspection parameters based on the specific transistor specifications detected. The system changes calculation parameters dynamically according to the transistor type, maintaining versatility while avoiding manual reconfiguration time.
Data Source
AI summary
An inspection device for performing operation inspection of a circuit including a transistor may include, but is not limited to, a standard calculating circuitry and a standard determining circuitry. The standard calculating circuitry is configured to calculate an electrical standard of the transistor on the basis of information on specifications of the transistor. The standard determining circuitry is configured to determine whether an inspection data group including temporal data of a value of current flowing in the transistor in a predetermined time range and of a value of voltage applied to the transistor satisfies the electrical standard and to output data which is determined not to satisfy the electrical standard in the inspection data group.