SoC Voltage Regulator Bypass for Parallel Power Domain Testing
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Solution Overview
Problem
Systems on a chip (SoCs) face challenges in accurately and comprehensively testing low voltage supply components due to limitations in bypassing voltage regulators, which restricts parallel testing and accurate voltage control during production, leading to inefficiencies and reduced testing capabilities.
Innovation Solution
A method and system for bypassing low voltage regulators on an SoC, allowing external power sourcing for multiple power domains, utilizing a test controller to manage switch operations and voltage detection circuits to ensure accurate voltage regulation and testing, enabling efficient parallel testing and improved testing accuracy.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If internal voltage regulators are used to power multiple power domains, then voltage regulation is maintained, but testing efficiency and parallel testing capability are reduced
Solution Approach 1:
The patent segments the power domains by introducing separate bypass paths for each power domain. Each bypass path includes switching circuitry that can independently connect external voltage sources to specific power domains, allowing parallel testing of multiple domains simultaneously while maintaining internal voltage regulation for other domains.
Solution Approach 2:
The patent introduces switching circuitry as an intermediary between external voltage sources and power domains. This intermediary enables controlled bypassing of internal voltage regulators during testing, allowing external voltage application without permanently disabling the regulators or affecting other power domains.
2Measurement precision
If voltage regulators are bypassed to allow external power sourcing, then testing accuracy is improved, but voltage control and regulation may be compromised
Solution Approach 1:
The patent implements dynamic switching between internal voltage regulators and external voltage sources based on operational mode. During normal operation, internal regulators provide stable voltage control. During testing, the switching circuitry dynamically connects external sources to specific power domains, and the system can transition between modes as needed.
Solution Approach 2:
The patent incorporates feedback mechanisms through voltage detection circuits that monitor voltage levels in power domains. These circuits provide information to control logic that manages the bypass switching, ensuring that external voltage sources are applied within safe ranges and that voltage regulation is maintained when internal regulators are active.
3Productivity
If internal voltage regulators are used, then voltage regulation is maintained, but parallel testing of multiple power domains is restricted
Solution Approach 1:
The patent segments the power distribution network into independent controllable paths, with each power domain having its own bypass switch. This segmentation enables the test controller to independently apply external voltages to multiple power domains in parallel, significantly improving testing throughput and capability.
4Productivity
If bypass circuitry is added to enable external power sourcing, then testing efficiency improves, but device complexity increases
Solution Approach 1:
The patent designs the bypass switching circuitry to serve multiple functions: enabling external voltage application during testing, maintaining internal regulation during normal operation, and providing configurable voltage sources for different testing scenarios. This multi-functionality reduces the need for separate dedicated test circuits.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables efficient parallel testing and accurate voltage control across multiple power domains, enhancing testing efficiency and reducing resource consumption by allowing external power supply to bypass internal voltage regulators, thus improving the testing process for SoC components.
Implementation Method 1
utilizing a test controller to manage switch operations and voltage detection circuits to ensure accurate voltage regulation and testing
Data Source
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AI summary
A method to bypass a voltage regulator (1010) of a system on a chip (SOC) (1000) comprising powering a first power domain (1002) of the SOC using a voltage regulator (1010); powering a second power domain (1004) of the SOC using the voltage regulator (1010); coupling a third power domain (1006) of the SOC with an external voltage source; raising an external voltage supply from the external voltage source above a threshold level of the voltage regulator (1010); coupling the first and second power domains to the external voltage source; turning OFF the voltage regulator (1010) of the SOC after coupling the first power domain (1002) of the SOC (1000) and the second power domain (1004) of the SOC (1000) to the external voltage source; and powering the first power domain (1002) of the SOC (1000), the second power domain (1004) of the SOC (1000), and the third power domain (1006) of the SOC (1000) with the external voltage source, the external voltage source bypassing the voltage regulator (1010).