SOT-MRAM Structure With Composite Oxide Seed Layer for Read Reliability

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Solution Overview

Problem

Spin-transfer-torque magnetic random-access memory (STT-MRAM) devices face impaired read reliability due to shared read/write paths, which can stress the tunnel barrier layer, whereas spin-orbit torque magnetic random-access memory (SOT-MRAM) devices require separate paths to improve performance.

Innovation Solution

The SOT-MRAM device incorporates a spin orbit torque line and a composite metal oxide seed layer beneath a magnetic tunnel junction, enabling efficient transverse spin-current transmission and interface perpendicular magnetic anisotropy for fast switching and data retention, with separate read/write paths.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Device complexity

If a shared read/write path is used in STT-MRAM devices, then the device structure is simplified, but the tunnel barrier layer is impaired and read reliability deteriorates

Engineering Contradiction:
Improvedevice structureVSAvoidread reliability
Core Design Contradiction:
Device complexityVSReliability

Solution Approach 1:

The patent divides the read and write operations into separate paths: the write path uses the spin orbit torque line to switch magnetization, while the read path uses the magnetic tunnel junction with separate read electrodes. This segmentation prevents write current from damaging the tunnel barrier layer during read operations, resolving the contradiction between structural simplicity and read reliability.

Inventive Principle:
Principle #1Segmentation

2Reliability

If spin-orbit torque line and composite metal oxide seed layer are added to SOT-MRAM devices, then switching efficiency and data retention are improved, but device complexity increases

Engineering Contradiction:
Improvedata retentionVSAvoiddevice structure
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The patent employs a composite metal oxide seed layer consisting of multiple oxide layers (e.g., MgO, AlOx, TaOx) with specific thicknesses and compositions. This composite structure provides optimized spin-current transmission, interface perpendicular magnetic anisotropy, and thermal stability, achieving improved data retention while managing the increase in device complexity through carefully engineered material composition.

Inventive Principle:
Principle #40Composite materials

3Speed

If high current is supplied to switch magnetization in SOT-MRAM, then switching speed is improved, but energy consumption increases

Engineering Contradiction:
Improveswitching speedVSAvoidswitching energy
Core Design Contradiction:
SpeedVSUse of energy by moving object

Solution Approach 1:

The patent optimizes multiple parameters to reduce switching energy while maintaining fast switching speeds: the composite metal oxide seed layer is engineered with specific thicknesses (e.g., 1-5 nm for MgO, 2-10 nm for AlOx) and compositions to maximize spin-current transmission efficiency and interface perpendicular magnetic anisotropy. The spin orbit torque line material (e.g., Pt, Ta, W) and thickness are also optimized to minimize the current required for magnetization switching, thereby reducing energy consumption while achieving sub-nanosecond switching speeds.

Inventive Principle:
Principle #35Parameter changes

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration allows for efficient and effective operation of SOT-MRAM devices with fast switching, low switching current/energy, and sufficient data retention, improving upon the read reliability of STT-MRAM devices by decoupling read and write paths.

Implementation Method 1

To write to the SOT-MRAM, the magnetization of the free magnetic layer is switched by supplying an in-plane current to a spin orbit torque (SOT) layer below the MTJ

Methodology Applied
Scientific EffectSpin Hall Effect: Hall Effect

Implementation Method 2

SOT-MRAM devices require efficient spin-current transmission and interface perpendicular magnetic anisotropy for improved performance

Methodology Applied
Scientific EffectPerpendicular Magnetic Anisotropy: Anisotropy

Implementation Method 3

STT-MRAM devices include a magnetic tunnel junction (MTJ) having a tunnel barrier layer stacked between a magnetic free layer and a magnetic pinned (or fixed) layer

Methodology Applied
Scientific EffectTunnel Magnetoresistance: Magnetoresistance

Data Source

PatentUS20240023458A1Spin-orbit torque magnetic random-access memory (sot-MRAM) device
Publication Date: 2024.01.18 SAMSUNG ELECTRONICS CO LTD
  • US20240023458A1 patent drawing
  • US20240023458A1 patent drawing

AI summary

A spin-orbit torque magnetic random-access memory (SOT-MRAM) device includes a substrate, a spin orbit torque line above the substrate, a composite-metal-oxide seed layer above the spin orbit torque line, and a magnetic tunnel junction above the composite-metal-oxide seed layer. The magnetic tunnel junction includes a free layer above the composite-metal-oxide seed layer, a main tunneling barrier layer above the free layer, and a pinned layer above the main tunneling barrier layer.