SPAD Pixel Merging Detection and Count Circuits
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Solution Overview
Problem
Solid-state imaging devices face challenges in maintaining spatial resolution due to difficulties in photon counting in detection pixels and the need for specialized devices and equipment, which increases costs and complexity in manufacturing.
Innovation Solution
The implementation of a solid-state imaging device with a plurality of pixel blocks, each containing SPAD pixels equipped with detection and count circuits. The detection circuit in at least one SPAD pixel detects variations in incident light, while the count circuit in other SPAD pixels counts incident photons, allowing for improved imaging capabilities without adding additional detection circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate detection pixels and count pixels are used in solid-state imaging devices, then photon counting capability is improved, but spatial resolving power is reduced and device complexity increases
Solution Approach 1:
The patent merges the detection circuit and count circuit into a single SPAD pixel structure. The detection circuit detects variations in incident light while the count circuit counts incident photons, both functions coexisting in the same pixel without requiring separate detection pixels and count pixels. This integration maintains spatial resolution while enabling photon counting capability.
Solution Approach 2:
The SPAD pixel is designed to perform multiple functions simultaneously: it acts as both a detection pixel for monitoring light variations and a count pixel for photon counting. This multi-functionality eliminates the need for specialized separate circuits and maintains uniform pixel characteristics across the imaging array, preserving spatial resolving power.
2Adaptability or versatility
If separate detection pixels and count pixels are implemented, then imaging and photon counting functions are enhanced, but device complexity and manufacturing costs increase
Solution Approach 1:
The patent combines detection and counting functions within the same SPAD pixel structure, eliminating the need for separate specialized circuits. The detection circuit and count circuit share the same pixel architecture, reducing device complexity while maintaining both imaging and photon counting capabilities.
Solution Approach 2:
The SPAD pixel serves as a universal element that performs both detection and counting functions. This multi-functional design eliminates the need for specialized separate circuits and maintains uniform pixel characteristics across the imaging array, preserving spatial resolving power.
3Measurement precision
If separate detection pixels and count pixels are used, then light variation detection and photon counting are improved, but manufacturing processes and equipment requirements increase
Solution Approach 1:
The patent merges detection and counting functions into a single integrated circuit structure within each SPAD pixel. This integration allows both functions to be manufactured using the same standard semiconductor fabrication processes, eliminating the need for specialized separate manufacturing equipment and processes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration helps preserve spatial resolution in imaging and reduces the complexity and cost of manufacturing by eliminating the need for additional detection circuits, thereby minimizing the increase in processes and area occupied by the device.
Implementation Method 1
a single-photon avalanche diode (SPAD) that uses avalanche amplification where a plurality of carriers are generated when one photon is incident on a PN junction
Implementation Method 2
a detection circuit configured to detect a variation of light incident on the plurality of SPAD pixels
Data Source
AI summary
A solid-state imaging device includes a plurality of pixel blocks, wherein each pixel block of the plurality of pixel blocks includes a plurality of single-photon avalanche diode (SPAD) pixels configured for imaging, and at least one SPAD pixel of the plurality of SPAD pixels includes a detection circuit configured to detect a variation of light incident on the plurality of SPAD pixels.