Spectrophotometer Color Measurement With Second-Order Diffraction Compensation
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Solution Overview
Problem
Existing spectrophotometers face challenges in accurately measuring color properties due to second-order diffraction errors, which distort measurements without costly equipment or complex manufacturing changes.
Innovation Solution
A method using wavelength-dependent compensation factors, derived from narrow-band light sources or empirical data, to correct second-order diffraction errors by calculating diffraction ratios and applying them to raw data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If linear-variable long-pass filters are used to remove second-order diffraction effect, then measurement precision is improved, but device complexity and manufacturing cost increase
Solution Approach 1:
The patent extracts and removes the harmful second-order diffraction component from the measured signal through computational methods. By identifying and subtracting the SODE contribution from the total signal, the system achieves accurate measurement without requiring physical filters to be installed in the optical path.
Solution Approach 2:
The patent replaces the mechanical/optical filtering approach with a computational/software-based solution. Instead of using linear-variable long-pass filters that require precise mechanical alignment, the system uses algorithms to calculate and remove second-order diffraction effects from the measured data, thereby eliminating the need for complex optical components and their alignment procedures.
2Measurement precision
If linear-variable long-pass filters are used to remove second-order diffraction effect, then measurement precision is improved, but manufacturing cost increases
Solution Approach 1:
The patent employs computationally processed data as a temporary, disposable solution to eliminate the need for expensive permanent optical filters. The software-based correction method can be implemented through simple calibration procedures and mathematical processing, avoiding the high manufacturing costs associated with producing and aligning precision optical filters in tens of thousands of spectrometers.
Solution Approach 2:
The patent replaces expensive mechanical/optical filtering hardware with cost-effective computational methods. By using algorithms to remove second-order diffraction effects, the system eliminates the need for costly linear-variable long-pass filters and their complex manufacturing and alignment processes, thereby significantly reducing production costs while maintaining measurement accuracy.
3Measurement precision
If traditional filter-based methods are used to compensate second-order diffraction error, then measurement accuracy is improved, but ease of operation deteriorates due to careful alignment requirements
Solution Approach 1:
The patent enables the spectrometer to self-correct for second-order diffraction effects through built-in computational algorithms. The system automatically identifies and removes SODE from measured signals without requiring external alignment procedures or manual intervention, thereby making the instrument easier to operate while maintaining high measurement accuracy.
Solution Approach 2:
The patent replaces manual alignment procedures with automated computational correction. Instead of requiring operators to carefully align physical filters during setup and maintenance, the system uses software algorithms to automatically compensate for second-order diffraction effects, thereby eliminating the operational complexity and skill requirements associated with traditional filter-based methods.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Accurately compensates for second-order diffraction errors in spectrophotometer measurements without requiring expensive filters or intricate manufacturing adjustments, enhancing measurement precision.
Implementation Method 1
due to second-order diffraction effect (SODE), the grating will deliver part of a certain wavelength (such as 350 nm) light towards the same direction of the light that has twice the wavelength (such as 700 nm)
Data Source
AI summary
In one or more implementations, an apparatus, system or method is provided to compensate for second-order diffraction error (SODE) in connection with color or light measurements of a sample. In one particular implementation, methods and systems have been developed to compensate for SODE in a spectrophotometer by using a set of wavelength-dependent compensation factors or called diffraction ratios. The compensation factors can be generated with a narrow-band light source that covers the lower part of the wavelength range of the spectrophotometer but not the higher part of the wavelength range where the second-order diffraction error occurs and can be applied to the raw data of the spectrophotometer to compensate for the second-order diffraction error.