Spectrum Generation Using Diffraction Elements TRIZ Cases
- Filament Waveguide Layout for Low-Loss Slit Spectrometer Input
Reflective-coated filaments reshape circular light input into a slit output, cutting coupling loss and stabilizing spectrometer collimation.
- Hyperspectral Sensor Pixels Using Diffractive Focusing and Partial Filters
Diffractive focusing features and partial wavelength filters improve color sensing sensitivity, resolution, and noise tolerance without absorptive filters.
- Diffractive Beam Propagation Camera for Weak Light Analysis
A diffractive beam splitter creates spatially separated, focus-offset sub-beams to improve weak infrared beam analysis and droplet positioning.
- Beam Propagation Camera With Diffractive Multi-Focus Beam Splitting
Diffractive beam splitting creates spatially separated partial beams with focus offsets, improving low-intensity beam and droplet position measurement.
- Hyperspectral sensor with diffractive focusing elements and color filters
Diffractive focusing elements and partial wavelength filters improve low-light color accuracy while reducing crosstalk and light loss.
- Cholesteric Liquid Crystal Spectroscope for High-Angle Diffraction
Opposed cholesteric liquid crystal layers and a C-plate maintain diffraction efficiency at high angles for compact, faster spectrum measurement.
- Magnetoresistive Optical Analysis for Miniaturized Spectral Detection
Magnetic elements replace bulky photodetectors to detect reflected or transmitted light, enabling compact spectral analysis in portable terminals.
- Concave Diffraction Grating Transfer for Uniform Blaze Angles
A flat grating with stretchable or low-friction sections is transferred onto curved substrates to prevent wrinkling and keep blaze angles uniform.
- Heat-Shrink Diffraction Grating for Sub-Wavelength Groove Fabrication
A transferred grating pattern is thermally shrunk on resin to create sub-wavelength grooves beyond lithography limits for higher analysis sensitivity.
- Spectrophotometer Color Measurement With Second-Order Diffraction Compensation
Second-order diffraction distorts spectrophotometer color readings; wavelength-dependent ratios correct raw data without costly optical filters.
- Multi-Order Spectrometer Detection for Wide Wavelength Coverage
Wide-range spectrometers can lose diffraction efficiency; dedicated detection regions route selected orders for simultaneous wavelength measurement.
- Semiconductor Measurement Monochromator for Polarization-Independent Scanning
A multi-grating monochromator separates polarization paths for continuous wavelength scanning and more precise semiconductor measurement.
- Wavelength-Specific Diffractive Neural Networks for Crosstalk Reduction
Light guides route each wavelength to its optimized diffractive network, reducing crosstalk for accurate, energy-efficient detection.
- Micromechanical Dispersive Element for High-Speed Spectral Analysis
A micromechanical dispersive element deflects light about two axes to achieve simultaneous spectral and spatial resolution.
- Polarization-Insensitive Resonant Grating Filter Design
Dual orthogonal gratings decouple polarization sensitivity to enable wavelength tuning via polar angle variation.
- Concave Diffraction Grating Groove Alignment via Intermediary Substrate
An intermediary rigid substrate preserves groove pattern geometry during transfer, eliminating shape variations and mismatched intervals on curved surfaces.
- Dual Resolution Spectrometer for Semiconductor Thin Film Measurement
A dual resolution spectrometer separates light into two wavelength regions using distinct mirrors and a diffraction grating.
- Metrology Apparatus for Semiconductor Overlay and CD Measurement
A metrology apparatus extracts radiation components from a reflected beam using orthogonal polarization states and spatial filtering in the downstream pupil plane.
- Monochromator Wavelength Calibration Using Periodic Light Intensity Sampling
A monochromator calibration method measures reflected light intensity multiple times within each power supply cycle to locate the peak wavelength accurately.
- Light Irradiation Apparatus Using Diffraction Grating and Scanning Mirror
A light irradiation apparatus splits white light into multiple wavelengths using a diffraction grating and scanning mirror for precise selection.
- Particle Analyzer Mie Peak Monitoring for Decalibration Detection
A particle analyzer detects decalibration by monitoring the Mie peak position in the digital channel of the size-dependent frequency distribution.
- Optical Spectroscopy Device for Non-Invasive Blood Glucose Detection
Segmented optical detectors isolate blood glucose signals from interfering tissue layers while light funnels increase collected power.
- ZnSe Diffraction Grating on ZnS Substrate for Infrared Spectroscopy
ZnSe enables ductile-mode diamond tooling on the grating surface, resolving precision and productivity trade-offs in infrared spectroscopic apparatuses.
- Spectrometer with Segmented Aperture for High Throughput
Segmented entrance apertures and single-pixel detectors boost light throughput while resolving spectral resolution trade-offs.
- Optic System Spectral Shift for Sensor Communication
A spectral character shift optic system transmits measurement data via a single fiber.
- Phase Grating for EUV Mask Inspection Spectral Purity
A phase grating suppresses out-of-band radiation in EUV mask inspection systems.
- Tunable Filter Spectral Response Speed Testing
A tunable filter testing system converts spectral changes into spatial movements using a beam splitting element and image recording device.
- On-Chip Optical Filter Using Fabry-Perot Resonators
Sub-wavelength grating Fabry-Perot resonators enable on-chip spectral analysis, resolving the weight and volume constraints of conventional spectrometers.