Split Parameter Storage Across Secure Memories for Error Resilience
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Solution Overview
Problem
Electronic circuits that rely on stored parameters are susceptible to errors due to corruption from events like cosmic radiation, leading to malfunctions and potential device failures.
Innovation Solution
Storing parameter partial values in separate, physically distinct memories, where one memory is more secure and less susceptible to errors, allowing for continued operation with reduced accuracy if the less secure memory is corrupted, by combining values from both memories to maintain device functionality.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If parameters are stored in a single nonvolatile memory, then the device can operate with full accuracy, but the device is susceptible to errors from cosmic radiation or power failures
Solution Approach 1:
The parameter storage is segmented into two separate nonvolatile memories: a first nonvolatile memory storing a first parameter value and a second nonvolatile memory storing a second parameter value. This segmentation isolates the error susceptibility of each memory, so that an error in one memory does not necessarily corrupt the entire parameter set, thereby improving reliability while maintaining the ability to operate with full accuracy when both memories are functional.
2Reliability
If parameters are stored in separate memories, then error susceptibility is reduced, but device complexity increases
Solution Approach 1:
The system employs self-service error handling mechanisms where the processing unit automatically detects errors in parameter values from either memory and selects alternative parameter values from the other memory without requiring external intervention. This self-service approach manages the complexity of having separate memories by automating the error recovery process, reducing the burden on external error correction systems.
3Reliability
If error detection is implemented, then corrupted parameters can be identified, but device operation is interrupted for recalibration
Solution Approach 1:
The system ensures continuity of useful action by maintaining multiple parameter values in separate nonvolatile memories and enabling the processing unit to switch between them without interrupting device operation. When an error is detected in one parameter set, the system continues operating using parameter values from the other memory, thereby eliminating the need for recalibration interruptions and maintaining continuous productive operation.
4Reliability
If multiple parameter values are stored, then error resilience is improved, but memory resources are consumed
Solution Approach 1:
The system applies local quality by storing different types of parameter values in different memories based on their error susceptibility characteristics. The first nonvolatile memory and second nonvolatile memory may have different physical implementations or error resistance properties, and the system selectively uses parameter values from each memory based on their local quality characteristics, optimizing the balance between error resilience and memory resource usage.
Data Source
AI summary
Methods and devices are provided in which a first parameter partial value (p1) is stored in a first memory (12) and a second parameter partial value (p2) is stored in a second memory (13). A parameter value (p) of a parameter can then be obtained by combining the first parameter partial value (p1) with the second parameter partial value (p2).