Current-Domain In-Memory SRAM MAC With Voltage-to-Time Readout
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Solution Overview
Problem
Conventional in-memory compute SRAMs face limitations in computing accuracy, throughput, and energy efficiency due to non-linearities, process variations, and limited signal margins, especially at low voltage operations.
Innovation Solution
A 12T-SRAM design with a current-source transistor in the read-port, coupled to a voltage-to-time conversion block, enables a current-controlled structure that overcomes these limitations by providing linear, energy-efficient, and reconfigurable subthreshold MAC operations, with features like negative feedback and current sensing to adjust MAC speed and throughput.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If conventional in-memory compute SRAMs are used, then MAC operations can be performed in-place, but computing accuracy deteriorates due to non-linearities and process variations
Solution Approach 1:
The patent introduces a voltage-to-time conversion block as an intermediary between the voltage domain input signals and the current domain MAC operations. This conversion block transforms voltage inputs into time-domain signals that control the duration of current flow through the SRAM cells, thereby linearizing the MAC operation and reducing the impact of process variations and non-linearities while maintaining signal margins
Solution Approach 2:
The patent changes the operational domain from direct voltage-domain operations to time-domain controlled current operations. By converting the input voltage signals to time-domain pulse widths and using these to control current flow duration, the system achieves linear MAC operations with improved accuracy and reduced sensitivity to process variations
2Use of energy by moving object
If conventional in-memory compute SRAMs are used, then data movement is reduced, but energy efficiency deteriorates due to excessive power consumption
Solution Approach 1:
The patent employs periodic pulsed current operations where current flows through the SRAM cells only during specific time windows determined by the voltage-to-time conversion. This periodic action allows the system to perform MAC operations with controlled energy expenditure, reducing overall power consumption while maintaining computational functionality
Solution Approach 2:
The patent transitions from continuous voltage-domain operations to discrete time-domain pulsed operations. By controlling the duration and timing of current flow based on converted time signals, the system achieves superior energy efficiency with measured values of 580 TOPS/W for 1 kbit and 2128 TOPS/W for 16 kbit SRAM configurations
3Productivity
If conventional in-memory compute SRAMs are used, then parallelism is achieved, but throughput deteriorates due to limited signal margins
Solution Approach 1:
The voltage-to-time conversion block serves as a mediator that transforms voltage signals into time-domain control signals, enabling parallel MAC operations across multiple SRAM rows with improved signal margins. This conversion ensures that each parallel operation has sufficient time-window separation and signal integrity, thereby increasing overall throughput
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The design achieves high energy efficiency (580 TOPS/W for 1 kbit and 2128 TOPS/W for 16 kbit), improved MAC accuracy, and reduced process variations, eliminating the need for ADCs/DACs between neural network layers, while supporting different precisions and speeds.
Implementation Method 1
A read-port is coupled to a voltage-to-time (VTC) conversion block
Implementation Method 2
Analog MAC computing is performed by accumulating the SRAM cells' bitline discharging currents resulting from multiplying inputs by stored weights
Implementation Method 3
A current sense amplifier coupled to a read bit line on an output of the read-port
Data Source
AI summary
A static random-access memory (SRAM) device a read-port coupled to a voltage-to-time (VTC) conversion block. The read-port comprises a first transistor coupled to a pair of cross-coupled inverters. A pass gate transistor is coupled to the first transistor. A current-source transistor is coupled to the pass gate transistor. A row of the SRAM device is configured to generate a read wordline signal multiplied by one or more SRAM stored weights in response to receiving a voltage vector. The row is further configured to generate analog outputs for a multiply and compute operation (MAC).


