SRAM Cell With Ratioless Write Port for Ultra-Low VDD Writes
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Solution Overview
Problem
Existing SRAM cells require a strong write transistor ratio relative to the storage transistor, leading to inefficiencies in writing operations, particularly for Boolean operations like XOR and XNOR, due to the need for a 2:3 write ratio, which increases transistor size and complexity.
Innovation Solution
A dual port or 3-port SRAM cell design with a ratioless write port, where the write operation is enabled without needing to overcome the strength of the storage transistor, allowing for efficient Boolean operations like XOR and XNOR without the need for large transistors, achieved by modifying the circuit to enable writing without relying on the pull-up strength of the storage transistor.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a typical SRAM cell uses strong write transistors with a 2:3 write ratio to overwrite storage data, then the writing operation can be successful, but the transistor size and cell complexity increase
Solution Approach 1:
The patent divides the SRAM cell into separate functional components: storage transistors (maintaining data) and write transistors (performing write operations). By segmenting the write path from the storage latch, the write transistors can be optimized independently without increasing overall cell complexity. The write operation is segmented into controlled phases using write word line signals that isolate the write path from the storage latch during writing.
Solution Approach 2:
The patent prepares the write path in advance by pre-charging write bit lines and positioning write transistors in a ready state before the actual write operation. The write word line is activated beforehand to enable the write path, and the write transistors are positioned to connect the write bit lines to the storage latch only when needed, avoiding the need for continuously strong write transistors.
2Reliability
If the write transistor strength is increased to achieve a 2:3 write ratio for successful writing, then data can be overwritten, but the manufacturing cost and area increase
Solution Approach 1:
The patent makes the write transistor strength dynamic rather than static. Write transistors are sized normally but are activated only when write word line signals are applied. The effective strength of write transistors is dynamically adjusted through timing control and signal sequencing, allowing successful writes without requiring permanently oversized write transistors that would increase area and manufacturing cost.
Solution Approach 2:
The patent changes the operating parameters of the write operation by controlling the timing and sequence of write word line signals. Instead of relying on fixed transistor strength ratios, the write success is achieved by adjusting temporal parameters (signal timing, pulse width, sequencing) that enable the write path to temporarily overpower the storage latch only during the write window, reducing the need for larger write transistors.
3Adaptability or versatility
If traditional SRAM cells are used for Boolean operations like XOR and XNOR, then computation can be performed, but the write ratio constraint limits efficiency
Solution Approach 1:
The patent designs the SRAM cell to serve multiple functions: it can store data traditionally and also perform Boolean operations (AND, OR, NAND, NOR, XOR, XNOR) using the same cell structure. The write port is designed with universal control signals that can initiate either traditional write operations or Boolean computation operations, eliminating the need for separate circuitry for different operations and improving efficiency.
Solution Approach 2:
The SRAM cell performs Boolean operations using its own internal transistors and logic elements without requiring external computation circuits. The cell serves itself by utilizing the interaction between write transistors and storage transistors to naturally compute Boolean functions based on the states of write bit lines and storage nodes, eliminating the bandwidth bottleneck between separate computation and storage devices.
Data Source
AI summary
An ultra low VDD memory cell has a ratioless write port. In some embodiments, the VDD operation level can be as low as the threshold voltage of NMOS and PMOS transistors of the cell.


