SRAM Reading Circuit with Extracted Latch for Power and Speed
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Solution Overview
Problem
Traditional reading circuits for SRAM, which combine a sensitive amplifier and an SR latch, consume more power and require longer delay times to ensure reliability, thereby affecting reading speed.
Innovation Solution
A reading circuit comprising a sensitive amplifier circuit with two signal paths and a single-ended-output latch circuit, along with a matching circuit, to enhance reliability and reduce delay time, allowing for faster data reading while minimizing power consumption.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a traditional reading circuit combines a sensitive amplifier and an SR latch, then reliability is improved, but power consumption increases and reading speed decreases
Solution Approach 1:
The patent extracts the latch function from the traditional sensitive amplifier circuit and implements it as a separate single-ended-output latch circuit. This separation allows the sensitive amplifier to operate more efficiently with reduced power consumption while the latch circuit handles the data storage function, resolving the contradiction between reliability and power consumption.
Solution Approach 2:
The reading circuit is segmented into distinct functional blocks: a sensitive amplifier circuit with dual signal paths and a separate single-ended-output latch circuit. This segmentation allows each component to be optimized independently, enabling the sensitive amplifier to focus on signal amplification with lower power while the latch handles data latching, thus improving overall power efficiency without compromising reliability.
2Reliability
If a traditional reading circuit combines a sensitive amplifier and an SR latch, then reliability is improved, but reading speed decreases due to longer delay time
Solution Approach 1:
By extracting the latch function as a separate single-ended-output latch circuit, the patent eliminates the delay overhead associated with traditional combined architectures. The sensitive amplifier can operate with shorter delay times since it doesn't need to maintain the complex feedback structure of traditional SR latches, thereby improving reading speed while maintaining reliability through the dedicated latch circuit.
3Reliability
If a sensitive amplifier uses a longer delay time, then reliability is improved, but reading speed is affected negatively
Solution Approach 1:
The patent introduces dynamic control of the sensitive amplifier circuit through the single-ended-output latch circuit. The latch circuit dynamically manages the amplification process, allowing the sensitive amplifier to operate with optimized delay times rather than requiring fixed long delay times. This dynamic approach maintains reliability while reducing the time loss associated with excessive delay.
4Use of energy by moving object
If power consumption is reduced in the reading circuit, then energy efficiency is improved, but signal amplification quality may deteriorate
Solution Approach 1:
The segmentation of the reading circuit into a power-efficient sensitive amplifier and a dedicated latch circuit allows the amplifier to operate at lower power consumption levels. The latch circuit compensates for any reduction in amplification quality by providing stable data latching, thus maintaining overall signal quality while achieving better power efficiency.
Solution Approach 2:
The single-ended-output latch circuit acts as an intermediary between the sensitive amplifier and the output stage. It receives the amplified signal from the low-power sensitive amplifier and ensures proper signal levels and timing, thereby maintaining signal amplification quality even when the sensitive amplifier operates at reduced power consumption.
Data Source
AI summary
A reading circuit is provided in the invention. The reading circuit includes a sensitive amplifier circuit and a latch circuit. A sensitive amplifier circuit is coupled to a first bit line and a second bit line to connect with a storage device, and includes a first inverter and a second inverter. The first bit line is coupled to a source of a first transistor of the first inverter and the second bit line is coupled to a source of a second transistor of the second inverter. The latch circuit is coupled to the sensitive amplifier circuit and outputs an output signal generated by the sensitive amplifier circuit.