SRAM Sub-Array Architecture for Deterministic In-Memory Computing

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Solution Overview

Problem

Analog in-memory compute operations face issues such as inadvertent bit flips, non-deterministic computations, and complex circuitry, making them unsuitable for safety-critical applications.

Innovation Solution

A memory architecture that supports both conventional memory access and digital in-memory computation modes, utilizing a SRAM array segmented into sub-arrays, with a control circuit to switch between modes, enabling parallel access and deterministic computations.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Productivity

If analog in-memory compute operations are used, then computational efficiency is improved, but reliability deteriorates due to inadvertent bit flip and analog signal level variations

Engineering Contradiction:
Improvecomputational efficiencyVSAvoiddeterministic computation accuracy
Core Design Contradiction:
ProductivityVSReliability

Solution Approach 1:

The memory array is divided into multiple sub-arrays, each capable of independent operation. This segmentation allows selective activation of sub-arrays based on computational needs, enabling deterministic digital operations in specific regions while maintaining analog compute capabilities in others, thus resolving the reliability-efficiency contradiction.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The system dynamically switches between analog in-memory compute mode and digital readout mode based on operational requirements. The row decoder circuit can selectively actuate word lines to enable either wide vector access for analog computation or precise single-row access for digital operations, providing adaptive reliability for different computational tasks.

Inventive Principle:
Principle #15Dynamics

2Reliability

If conventional memory access mode is used, then reliability is maintained, but productivity deteriorates due to limited access speed

Engineering Contradiction:
Improvedata access accuracyVSAvoidmemory access speed
Core Design Contradiction:
ReliabilityVSProductivity

Solution Approach 1:

The memory circuit is designed to support multiple operational modes including conventional memory access mode and analog in-memory compute mode. The same memory array and control circuitry can be configured for either high-reliability conventional access or high-speed analog computation, eliminating the need for separate dedicated circuits for each function.

Inventive Principle:
Principle #6Universality (Multi-functionality)

3Productivity

If wide vector access is implemented for digital in-memory computation, then productivity is improved, but device complexity increases due to control circuit requirements

Engineering Contradiction:
Improvecomputation throughputVSAvoidrow decoder circuit complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The row decoder circuit automatically configures its operation based on the operational mode. In digital in-memory compute mode, it automatically enables wide vector access by simultaneously actuating multiple word lines. The control logic self-adjusts the decoding behavior without requiring external complex control mechanisms, simplifying the overall system architecture.

Inventive Principle:
Principle #25Self-service

Data Source

PatentUS12633323B2Memory architecture supporting both conventional memory access mode and digital in-memory computation processing mode
Publication Date: 2026.05.19 STMICROELECTRONICS INT NV
  • US12633323B2 patent drawing
  • US12633323B2 patent drawing
  • US12633323B2 patent drawing

AI summary

The memory array of a circuit includes sub-arrays with memory cells arranged in a row-column matrix where each row includes a word line and each sub-array column includes a local bit line. A control circuit supports two modes of circuit operation: a first mode where only one word line in the memory array is actuated during a memory read and a second mode where one word line per sub-array are simultaneously actuated during the memory read. An input/output circuit for each column includes inputs to the local bit lines of the sub-arrays, a column data output coupled to the bit line inputs, and a sub-array data output coupled to each bit line input. In memory computation operations are performed in the second mode as a function of feature data and weight data stored in the memory.