SSD Power Supply Latch Circuit for Over-Voltage Fault Identification

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Solution Overview

Problem

Data storage devices, such as solid-state drives, face failures due to over-voltage events, but existing protection mechanisms like fuses do not provide sufficient information about the underlying cause of the failure, making it difficult for system designers and manufacturers to identify and address the root issue.

Innovation Solution

A power supply circuit with a voltage clamp and a fuse in series, along with a switching device that latches into a forward conduction mode upon an over-voltage condition, providing both visual and electronic indications of an over-voltage event, and a method for detecting and storing such events within the data storage device.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a fuse is used to protect components from over-current conditions, then component reliability is improved, but information about the underlying cause of failure is lost

Engineering Contradiction:
Improvecomponent protectionVSAvoidfailure cause information
Core Design Contradiction:
ReliabilityVSLoss of information

Solution Approach 1:

The protection function is divided into two separate indicators: a fuse for over-current protection and a latch circuit for over-voltage detection. Each indicator serves a specific detection purpose, allowing independent identification of different failure modes without mixing information.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

A latch circuit acts as an intermediary between the voltage clamp and the external world. When the voltage clamp conducts due to over-voltage, the latch circuit captures and holds this state, providing a persistent indicator that survives power cycling and allows later analysis of the over-voltage event.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If a voltage clamp is added to detect over-voltage conditions, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveover-voltage detection capabilityVSAvoidpower supply circuit complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The voltage clamp serves dual purposes: it protects components from over-voltage by clamping excessive voltage, and simultaneously provides detection information by triggering the latch circuit when over-voltage occurs. This combines protection and detection functions in a single component.

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The latch circuit is pre-configured to automatically trigger when the voltage clamp conducts, capturing the over-voltage event state before any further damage occurs. This preliminary action ensures the failure information is preserved immediately upon event occurrence.

Inventive Principle:
Principle #10Preliminary action

3Ease of repair

If a latch circuit is added to indicate over-voltage events, then ease of repair is improved, but device complexity increases

Engineering Contradiction:
Improvefault identificationVSAvoidprotection circuit complexity
Core Design Contradiction:
Ease of repairVSDevice complexity

Solution Approach 1:

The latch circuit provides a visual or electrical indicator (analogous to a color change) that clearly distinguishes between over-voltage and over-current failure modes. This allows repair personnel to quickly identify the type of failure without complex diagnostic equipment.

Inventive Principle:
Principle #32Color changes

Solution Approach 2:

The latch circuit creates a copy or replica of the over-voltage event state that persists after the event. This copied state can be analyzed later without requiring the original over-voltage condition to be present, simplifying diagnostic procedures.

Inventive Principle:
Principle #26Copying

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

Enables system engineers to quickly pinpoint over-voltage faults in power supplies, preventing further failures by providing additional information about the cause of fuse operation, thus improving fault detection and prevention in data storage devices.

Implementation Method 1

a voltage clamp configured to operate in a conduction state in response to an over-voltage condition of the power supply circuit

Methodology Applied
Scientific EffectVoltage clamp conduction: Electrical Resistance

Implementation Method 2

The fuse is configured to open in response to a current flowing through the fuse and the voltage clamp exceeding a threshold value

Methodology Applied
Scientific EffectFuse operation: Joule Heating

Implementation Method 3

a switching device configured to latch in a forward conduction mode in response to the voltage clamp operating in the conduction state

Methodology Applied
Scientific EffectLatching conduction: Electrical Resistance

Data Source

PatentUS11908529B2Data storage device having over-voltage detection and protection
Publication Date: 2024.02.20 SANDISK TECHNOLOGIES LLC
  • US11908529B2 patent drawing
  • US11908529B2 patent drawing
  • US11908529B2 patent drawing

AI summary

A data storage device includes a power supply circuit configured to supply power to the data storage device. The power supply circuit includes a voltage clamp configured to operate in a conduction state in response to an over-voltage condition of the power supply circuit. The power supply circuit also includes a fuse in series with the voltage clamp. The fuse is configured to open in response to a current flow through the fuse and the voltage clamp exceeding a threshold value. The power supply circuit also includes a switching device that is configured to latch in a forward conduction mode in response to the voltage clamp operating in the conduction state. The switching device couples power from a positive voltage bus to the voltage clamp when the switching device is in the forward conduction mode.