Stacked Electrode Interconnection for 3D Memory Density

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Solution Overview

Problem

The integration of two-dimensional or planar semiconductor memory devices is limited by the expensive process equipment required for fine pattern formation, hindering increased performance and cost-effectiveness, while three-dimensional memory devices offer potential but require innovative interconnection solutions to enhance integration density.

Innovation Solution

A semiconductor device with vertically stacked electrode structures and stair-step configurations, including string selection electrodes and connection lines, allows for increased integration density by optimizing the arrangement of memory cells and signal lines in a three-dimensional format, enabling efficient connection and data transmission.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Quantity of substance

If two-dimensional or planar semiconductor memory devices use fine pattern formation technology to increase integration, then integration density is improved, but manufacturing cost increases due to expensive process equipment

Engineering Contradiction:
Improveintegration densityVSAvoidmanufacturing cost
Core Design Contradiction:
Quantity of substanceVSEase of manufacture

Solution Approach 1:

The patent transitions from two-dimensional planar memory structures to three-dimensional stacked electrode structures. Multiple electrodes are vertically stacked and alternatingly arranged, creating a multi-layered configuration that increases integration density without requiring finer lateral patterning. This vertical stacking approach allows more memory cells to be packed into the same footprint area while avoiding the need for expensive fine-patterning equipment.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Quantity of substance

If three-dimensional memory devices are implemented to increase integration density, then manufacturing cost is reduced, but device complexity increases due to intricate interconnection requirements

Engineering Contradiction:
Improveintegration densityVSAvoidinterconnection complexity
Core Design Contradiction:
Quantity of substanceVSDevice complexity

Solution Approach 1:

The patent divides the three-dimensional structure into distinct alternating electrode layers (first electrodes and second electrodes) separated by insulating layers. Each electrode structure is segmented into discrete stacked units that can be independently formed and connected. This segmentation simplifies the interconnection scheme by allowing systematic connection patterns between corresponding electrodes in adjacent stacks, reducing the overall complexity of the three-dimensional interconnection network.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent combines multiple electrode structures into alternating stacked configurations where first electrodes and second electrodes are vertically integrated with insulating layers. This merging of multiple functional layers into a unified stacked structure reduces the number of separate interconnection steps required compared to implementing separate two-dimensional layers, thereby simplifying the overall device architecture while maintaining high integration density.

Inventive Principle:
Principle #5Merging (Combining)

Data Source

PatentUS10546876B2Semiconductor devices including stacked electrodes
Publication Date: 2020.01.28 SAMSUNG ELECTRONICS CO LTD
  • US10546876B2 patent drawing
  • US10546876B2 patent drawing
  • US10546876B2 patent drawing

AI summary

Semiconductor devices are provided. A semiconductor device includes first and second stacks of electrodes. Moreover, the semiconductor device includes first and second connection lines that connect the first and second stacks of electrodes. In some embodiments, the first connection lines have a first length and the second connection lines have a second length that is longer than the first length of the first connection lines. In some embodiments, the first connection lines connect inner portions of the first stack of electrodes to inner portions of the second stack of electrodes. In some embodiments, the second connection lines connect outer portions of the first stack of electrodes to outer portions of the second stack of electrodes.