Stacked Image Sensor With Variable Resistance Memory Buffering

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Solution Overview

Problem

Current image sensors face challenges in enhancing performance for applications in digital cameras, smartphones, and medical devices due to limitations in pixel arrangement, photoelectric conversion efficiency, and signal processing capabilities.

Innovation Solution

The proposed image sensor design incorporates multiple chips with a photoelectric conversion layer, color filter, microlens, transistors, and a variable resistance element, along with a contact plug connecting the chips, to improve light conversion and signal processing efficiency, and includes a memory region with magnetic random access memory for enhanced image buffering and processing.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Reliability

If a single chip structure is used, then the device complexity is low, but the photoelectric conversion efficiency and signal processing capability are limited

Engineering Contradiction:
Improvephotoelectric conversion efficiencyVSAvoiddevice complexity
Core Design Contradiction:
ReliabilityVSDevice complexity

Solution Approach 1:

The image sensor is divided into multiple separate chips: a first chip containing the photoelectric conversion layer and a second chip containing the variable resistance element and memory region. This segmentation allows each chip to be optimized for its specific function, improving photoelectric conversion efficiency while enabling complex signal processing capabilities that would be difficult to achieve in a single integrated chip.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent transitions from a planar single-chip architecture to a three-dimensional stacked multi-chip architecture. The first and second chips are vertically stacked and connected through bonding interfaces, utilizing the vertical dimension to increase functional density and enable both high photoelectric conversion efficiency and advanced signal processing without increasing the horizontal footprint.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Productivity

If multiple chips are stacked to improve performance, then light conversion efficiency and signal processing improve, but manufacturing complexity increases

Engineering Contradiction:
Improvesignal processing capabilityVSAvoidmanufacturing complexity
Core Design Contradiction:
ProductivityVSEase of manufacture

Solution Approach 1:

By segmenting the image sensor into specialized first and second chips, each chip can be manufactured using optimized processes for its specific function. The first chip focuses on photoelectric conversion with appropriate layer structures, while the second chip implements memory and variable resistance elements, allowing independent manufacturing optimization before final stacking.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent introduces bonding pads and bonding interfaces as intermediary elements that facilitate the connection between the first and second chips. These intermediaries provide standardized interfaces for electrical and mechanical coupling, simplifying the stacking process and enabling modular manufacturing where chips can be produced separately and then assembled with controlled complexity.

Inventive Principle:
Principle #24Intermediary (Mediator)

3Quantity of substance

If conventional memory is used, then the image buffering capacity is sufficient, but the manufacturing cost and device size increase

Engineering Contradiction:
Improveimage buffering capacityVSAvoiddevice size
Core Design Contradiction:
Quantity of substanceVSArea of stationary object

Solution Approach 1:

The patent changes the fundamental parameter of memory implementation by using variable resistance elements (such as phase-change materials or resistive switching materials) instead of conventional transistor-based memory cells. This parameter change enables higher density memory storage with smaller footprint, as variable resistance elements can achieve multiple storage states in a compact structure, thereby increasing image buffering capacity while reducing device area.

Inventive Principle:
Principle #35Parameter changes

Solution Approach 2:

The second chip employs composite material structures combining variable resistance elements with memory region materials to create a hybrid memory system. This composite approach integrates the advantages of different materials to achieve high-density storage with reduced area, providing sufficient image buffering capacity in a compact form factor that reduces overall device size.

Inventive Principle:
Principle #40Composite materials

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This design enhances image sensor performance by improving light conversion efficiency, reducing noise, and enabling efficient signal processing, thereby improving image quality and reducing manufacturing costs and size.

Implementation Method 1

The photodiode converts incident light into an electrical signal

Methodology Applied
Scientific EffectPhotoelectric effect: Photoelectric Effect

Implementation Method 2

a first variable resistance element on the first contact in the second insulating layer and between the first and second metal layers, and is connected to the second metal layer

Methodology Applied
Scientific EffectVariable resistance: Electrical Resistance

Data Source

PatentUS12148784B2Image sensor
Publication Date: 2024.11.19 SAMSUNG ELECTRONICS CO LTD
  • US12148784B2 patent drawing
  • US12148784B2 patent drawing
  • US12148784B2 patent drawing

AI summary

An image sensor including a variable resistance element is provided. The image sensor comprises first and second chips having first and second connecting structures; and a contact plug connecting the first and second chips. The first chip includes a photoelectric conversion element. The second chip includes a first variable resistance element. The contact plug extends from the first surface of the first semiconductor substrate to connect the first and second connecting structures.