Stage Device Optical Axis Z-Motion Abbe Error Reduction

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Solution Overview

Problem

Existing stage devices for charged particle beam systems face increased costs and positioning errors due to the need for multiple interferometers and elevated mirror heights, which lead to increased movable mass and thermal deformation, affecting Abbe error and field-of-view positioning accuracy.

Innovation Solution

A stage device with a Z-axis mechanism that moves the optical axis of the laser interferometer, allowing for reduced mirror weight and Abbe error without increasing the stage's size or movable mass, by integrating the interferometer and mirror movement within the sample chamber, and using a penta-Dach mirror or prism to maintain optical axis alignment.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If the height of the mirror is increased to measure inclination in the Z direction, then the measurement capability is improved, but the movable mass of the stage increases and vibration increases

Engineering Contradiction:
Improveinclination measurement capabilityVSAvoidmovable mass of the stage
Core Design Contradiction:
Measurement precisionVSWeight of moving object

Solution Approach 1:

Instead of moving the mirror up and down with the stage, the patent inverts the approach by keeping the mirror stationary and moving the optical axis of the interferometer with the stage. This eliminates the need to increase mirror height while maintaining the ability to measure inclination in the Z direction across the full operating stroke.

Inventive Principle:
Principle #13The other way round (Inversion)

Solution Approach 2:

The patent transitions from moving the mirror in the Z direction to moving the optical axis in the Z direction. This dimensional shift allows the same measurement function to be achieved without increasing the mirror's height or the stage's movable mass.

Inventive Principle:
Principle #17Another dimension (Dimensionality change)

2Measurement precision

If the height of the mirror is increased to cover the Z direction operating stroke, then the measurement range is improved, but thermal deformation increases due to increased heat generation

Engineering Contradiction:
Improvepositioning accuracyVSAvoidthermal deformation
Core Design Contradiction:
Measurement precisionVSTemperature

Solution Approach 1:

The patent inverts the conventional approach by keeping the mirror stationary and moving the optical axis instead. This eliminates the need to increase mirror height to cover the Z direction operating stroke, thereby reducing heat generation and thermal deformation while maintaining full measurement range.

Inventive Principle:
Principle #13The other way round (Inversion)

3Measurement precision

If multiple interferometers are added to measure inclination, then the measurement capability is improved, but the device complexity and cost increase

Engineering Contradiction:
Improveinclination measurement capabilityVSAvoidnumber of interferometers
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent makes the single interferometer multi-functional by enabling its optical axis to move in the Z direction. This allows the same interferometer to measure positions at different heights, eliminating the need for multiple interferometers while maintaining the capability to measure inclination and correct Abbe errors.

Inventive Principle:
Principle #6Universality (Multi-functionality)

Solution Approach 2:

The patent introduces dynamic movement of the optical axis along the Z direction, transforming a static interferometer setup into a dynamic one. This allows a single interferometer to perform the function of multiple interferometers by adjusting its measurement plane to match the sample surface at different Z positions.

Inventive Principle:
Principle #15Dynamics

4Measurement precision

If the mirror height is increased, then the Abbe error reduction capability is improved, but the positioning error due to table deformation increases

Engineering Contradiction:
ImproveAbbe error correctionVSAvoidpositioning error due to table deformation
Core Design Contradiction:
Measurement precisionVSManufacturing precision

Solution Approach 1:

The patent inverts the conventional approach by keeping the mirror stationary and moving the optical axis instead. This eliminates the need to increase mirror height, thereby avoiding the associated table deformation and positioning errors while maintaining the capability to correct Abbe errors through optical axis adjustment.

Inventive Principle:
Principle #13The other way round (Inversion)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This configuration reduces Abbe error and field-of-view positioning errors, improving accuracy and throughput while minimizing the stage's size and manufacturing costs by maintaining optical axis alignment and reducing thermal deformation.

Implementation Method 1

a laser interferometer that radiates a laser beam towards the mirror and receiving reflected light from the mirror to measure a position of the table in the X direction

Methodology Applied
Scientific EffectLaser: Laser

Implementation Method 2

receiving reflected light from the mirror

Methodology Applied
Scientific EffectReflection: Reflection

Data Source

PatentUS10600614B2Stage device and charged particle beam device
Publication Date: 2020.03.24 HITACHI HIGH TECH CORP
  • US10600614B2 patent drawing
  • US10600614B2 patent drawing
  • US10600614B2 patent drawing

AI summary

The present invention is to provide a stage device capable of improving field-of-view positioning accuracy of a stage having a Z-axis mechanism. The invention is directed to a sample stage device having a first table that moves a sample in a first direction, a second driving mechanism that moves the first table in a second direction different from the first direction, and a part having a function of moving a laser interferometer optical axis that measures the position of the first table, in the second direction.