Standard Cell Pin Layout for Boundary-Safe Interconnect Routing
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Solution Overview
Problem
As technology advances and the demand for scaled integrated circuits grows, existing electronic design automation tools face challenges in efficiently routing interconnects due to restrictions imposed by wire cuts at standard cell boundaries, limiting the area available for interconnects and potentially leading to electrical shorts.
Innovation Solution
Modifying the dimensions of standard cell pins to increase their distance from boundaries, thereby avoiding the placement of wire cuts and providing additional area for interconnect routing, while ensuring a minimum distance to prevent electrical shorts, as defined by the equation Minimum Distance = Wcut + [½·Wvia] + Dmin, based on specific technology nodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If wire cuts are placed at standard cell boundaries to prevent electrical shorts, then electrical integrity is improved, but the area available for interconnect routing is reduced
Solution Approach 1:
The pin dimensions are modified in advance during the design phase to anticipate and prevent the need for wire cuts at cell boundaries. By proactively adjusting pin positions and sizes before routing, the method eliminates future routing restrictions while maintaining electrical integrity through controlled spacing.
Solution Approach 2:
The physical parameters of standard cell pins are changed by modifying their dimensions and positions relative to cell boundaries. This parameter adjustment creates sufficient spacing to prevent electrical shorts without requiring wire cuts, thereby preserving routing area while maintaining reliability.
2Area of stationary object
If pin dimensions are increased to provide more routing area, then interconnect routing flexibility is improved, but the distance from boundaries is reduced increasing electrical short risk
Solution Approach 1:
The method carefully adjusts pin parameters (dimensions and positions) to achieve optimal balance. Pins are modified to extend further into the cell body, increasing available routing area, while simultaneously maintaining adequate distance from cell boundaries to prevent electrical shorts through controlled parameter selection.
Solution Approach 2:
Different regions of the standard cell are treated differently: pin areas are expanded to provide routing flexibility, while boundary regions maintain sufficient clearance for electrical integrity. This localized quality adjustment allows simultaneous optimization of both routing area and reliability.
3Adaptability or versatility
If standard cell pins are positioned closer to boundaries to maximize routing area, then interconnect flexibility is improved, but the risk of electrical shorts increases
Solution Approach 1:
Pin positions are pre-optimized during the design phase to achieve the maximum safe distance from boundaries. This preliminary positioning action enables flexible interconnect routing while preemptively preventing electrical short risks that would occur with closer positioning.
Solution Approach 2:
The modified pin structure acts as an intermediary element that mediates between the conflicting requirements of routing flexibility and electrical safety. By adjusting pin geometry and position, it provides sufficient routing access while maintaining the necessary safety margin from cell boundaries.
Data Source
AI summary
The present disclosure describes an example method for routing a standard cell with multiple pins. The method can include modifying a dimension of a pin of the standard cell, where the pin is spaced at an increased distance from a boundary of the standard cell than an original position of the pin. The method also includes routing an interconnect from the pin to a via placed on a pin track located between the pin and the boundary and inserting a keep out area between the interconnect and a pin from an adjacent standard cell. The method further includes verifying that the keep out area separates the interconnect from the pin from the adjacent standard cell by at least a predetermined distance.