Storage Chip Write Recovery Timing Under Temperature Variation
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
The existing memory devices face issues with data loss and reduced operation speed due to prolonged or shortened writing recovery times caused by temperature variations, leading to incomplete writing operations under low or high-temperature environments.
Innovation Solution
A method that adjusts the writing recovery time of a memory device based on its temperature, ensuring it aligns with the actual writing time required, by using a temperature detection unit and a controlling chip to monitor and adjust the writing recovery time in real-time.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a fixed writing recovery time is used regardless of temperature, then the device complexity is low, but the reliability deteriorates due to data loss from incomplete writing operations
Solution Approach 1:
The patent applies dynamics by making the writing recovery time adjustable rather than fixed. The memory device dynamically changes the writing recovery time parameter based on detected temperature conditions, allowing the system to adapt to varying thermal environments and ensure complete writing operations without requiring complex additional hardware
Solution Approach 2:
The patent implements feedback by continuously monitoring the temperature of the memory device and using this information to adjust the writing recovery time. The temperature detection unit provides feedback to the control logic, which then modifies the writing recovery time parameter to maintain reliable writing operations across different temperature conditions
2Reliability
If the writing recovery time is extended to ensure complete writing, then the reliability improves, but the productivity deteriorates due to reduced operation speed
Solution Approach 1:
The patent uses dynamics to optimize the writing recovery time based on actual temperature conditions. Instead of always using a conservative long recovery time, the system adjusts the recovery time to be longer only when temperature conditions require it, and shorter when conditions permit, thereby maintaining reliability while maximizing operation speed
Solution Approach 2:
The patent changes the writing recovery time parameter according to temperature variations. By adjusting this critical timing parameter dynamically, the system ensures that writing operations are always given sufficient time to complete reliably, while avoiding unnecessary delays when temperature conditions allow for faster operation
Data Source
Figure 1
Figure 2~3
Figure 4~5
AI summary
The present application provides a read/write method for a storage device, and a storage device. The storage device comprises a storage chip. The read/write method for a storage device comprises, during running of a storage chip, measuring the temperature of the storage chip, and adjusting a write recovery time of the storage chip according to the temperature. The advantage of the present application is that the write recovery time of the storage chip can be adjusted according to the temperature of the storage chip, such that the write recovery time executed for the storage chip is substantially consistent with an actual write recovery time of the storage chip during a read/write operation, thus avoiding the situation of data loss or running speed reduction.