Storage Device Defect Scanning via Segmented Pre-Shipment Inspection
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Solution Overview
Problem
The increasing storage capacity of devices such as hard disk drives and solid state drives leads to a significant increase in the time required for defect scanning, thereby prolonging the manufacturing process.
Innovation Solution
Implementing a method where defect scanning is initially performed on only a part of the storage medium before shipment, with the remaining regions scanned during idle periods after deployment, utilizing a correspondence table to map logical addresses to non-defective physical addresses and skipping or replacing defective sectors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If defect scanning is performed on the entire storage medium before shipment, then data integrity and reliability are ensured, but manufacturing process time and productivity are significantly reduced
Solution Approach 1:
The defect scanning process is divided into two segments: a first scan performed on a first region of the storage medium before shipment, and a second scan performed on a second region after shipment during idle periods. This segmentation allows the device to be shipped earlier while completing full defect scanning over time, thus resolving the contradiction between ensuring data integrity and maintaining manufacturing productivity.
2Quantity of substance
If storage capacity is increased to meet growing data needs, then utility and functionality are improved, but defect scan time and manufacturing complexity increase
Solution Approach 1:
A preliminary defect scan is performed on a portion of the storage medium (first region) before shipment, sufficient to ensure data integrity for the shipped device. The remaining defect scan is deferred to be performed later on the second region during idle periods after shipment. This preliminary action approach allows larger storage capacities to be manufactured without proportionally increasing pre-shipment scan time.
Data Source
AI summary
A defect scan method is carried out to detect a defective portion in a storage medium of a storage device, the storage medium including multiple storage regions including a first storage region and a second storage region. The defect scan method includes scanning a part of the storage regions of the storage medium to detect a defective portion therein, before the storage device is connected to a host, a scanned storage region including the first storage region and a non-scanned storage region including the second storage region, mapping logical addresses to physical addresses of a non-defective portion of the first storage region, scanning the second storage region to detect a defective portion therein, after the storage device is connected to the host, and mapping logical addresses to physical addresses of a non-defective portion of the second storage region.