Stress Directing Material in IC Encapsulant
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Solution Overview
Problem
Traditional encapsulation processes for integrated circuits do not allow for the formation of stress directing structures within the encapsulant material, leading to potential detuning of sensitive circuits due to thermal and mechanical stress, and lack the ability to integrate additional package functions without increasing cost and complexity.
Innovation Solution
The integration of stress directing structures within the encapsulant material using additive manufacturing processes, which enables the deposition of patterned materials to isolate or focus mechanical and thermal stress on specific regions of the semiconductor die, and allows for the creation of heat sink capacity and mechanical isolation during the encapsulation process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If traditional encapsulation processes are used, then the package provides protection and mechanical strength, but stress directing structures cannot be formed within the encapsulant material
Solution Approach 1:
The patent combines encapsulant material with stress directing material to form a composite structure. The stress directing material is integrated within the encapsulant material to create a composite package structure that provides both protection and stress directing functionality, resolving the contradiction between maintaining protective encapsulation and enabling stress directing structures.
2Reliability
If stress directing structures are integrated into the encapsulant material, then stress control on the die is improved, but the device complexity increases
Solution Approach 1:
The patent merges the encapsulation function with the stress directing function into a single integrated structure. The stress directing structures are combined with the encapsulant material, eliminating the need for separate stress control components and reducing overall device complexity while maintaining stress control benefits.
Solution Approach 2:
The encapsulant material is given multiple functions: it provides both mechanical protection/encapsulation and stress directing control. This multi-functionality reduces the need for additional separate components, thereby managing device complexity while achieving improved stress control.
3Adaptability or versatility
If additional package functions are integrated into the encapsulation process, then functionality is enhanced, but manufacturing cost and complexity increase
Solution Approach 1:
The patent combines multiple package functions (encapsulation, stress directing, and heat sinking) into a single integrated manufacturing process. The stress directing structures are formed within the encapsulant material during the same encapsulation process, eliminating the need for separate manufacturing steps and reducing overall manufacturing cost and complexity.
Solution Approach 2:
The encapsulation process is designed to perform multiple functions simultaneously: providing mechanical protection, directing stress, and creating heat sink capacity. This multi-functional approach enhances package versatility while managing manufacturing cost and complexity by consolidating processes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach effectively minimizes or amplifies stress on sensitive areas of the die as needed, enhancing the functionality and reliability of integrated circuit packages while maintaining cost efficiency by integrating mechanical and acoustic functions directly into the encapsulation material.
Implementation Method 1
enables the deposition of patterned materials to isolate or focus mechanical and thermal stress on specific regions of the semiconductor die
Implementation Method 2
using additive manufacturing processes, which enables the deposition of patterned materials
Implementation Method 3
allows for the creation of heat sink capacity and mechanical isolation during the encapsulation process
Data Source
AI summary
An encapsulated integrated circuit that includes an integrated circuit (IC) die and an encapsulation material encapsulating the IC die. A first portion of the encapsulation material is solid and a second portion of the encapsulation material includes spaces filled with a second material.


